Title :
Visual analysis of frequent patterns in large time series
Author :
Hao, M.C. ; Marwah, M. ; Janetzko, H. ; Keim, D.A. ; Dayal, U. ; Sharma, R. ; Patnaik, D. ; Ramakrishnan, N.
Abstract :
The detection of previously unknown, frequently occurring patterns in time series, often called motifs, has been recognized as an important task. To find these motifs, we use an advanced temporal data mining algorithm. Since our algorithm usually finds hundreds of motifs, we need to analyze and access the discovered motifs. For this purpose, we introduce three novel visual analytics methods: (1) motif layout, using colored rectangles for visualizing the occurrences and hierarchical relationships of motifs in a multivariate time series, (2) motif distortion, for enlarging or shrinking motifs as appropriate for easy analysis and (3) motif merging, to combine a number of identical adjacent motif instances without cluttering the display. We have applied and evaluated our methods using two real-world data sets: data center cooling and oil well production.
Keywords :
data analysis; data mining; data visualisation; pattern recognition; time series; colored rectangle; data center cooling; motif distortion; multivariate time series; oil well production; pattern detection; real world data set; temporal data mining; visual analysis; visual analytics; Data mining; Layout; Merging; Petroleum; Production; Time series analysis; Visual analytics;
Conference_Titel :
Visual Analytics Science and Technology (VAST), 2010 IEEE Symposium on
Conference_Location :
Salt Lake City, UT
Print_ISBN :
978-1-4244-9488-0
Electronic_ISBN :
978-1-4244-9487-3
DOI :
10.1109/VAST.2010.5650766