DocumentCode
3321482
Title
An Efficient Method for Bottom-Up Extraction of Analog Behavioral Model Parameters
Author
Pam, Srikanth ; Bhattacharya, A.K. ; Mukhopadhyay, S.
Author_Institution
Dept. of Electr. Eng., Indian Inst. of Technol., Kharagpur, India
fYear
2010
fDate
3-7 Jan. 2010
Firstpage
363
Lastpage
368
Abstract
This paper presents a fast, accurate and robust method for bottom-up extraction of analog behavioral model parameters from the corresponding transistor level netlists. The proposed Verilog-A in-loop simulation based modeling approach is generic and can estimate the parameters of the corresponding model of any given circuit using relevant test-benches, thus removing the need to implement structure based estimation tools for each circuit. The models are usually non-linear with respect to the parameters and often the optimization problem becomes nonconvex. A hybrid method based on co-operation and switching between search and gradient methods is proposed for achieving significantly faster convergence to the global minima even in presence of local minima in such non-convex cases. This method is applied by the authors to a wide variety of analog circuits, and is demonstrated in the paper using two distinctly different analog circuits. Simulation results comparing the model and transistor level netlist show that high level of accuracy can be achieved. The comparison of the search, gradient and the proposed hybrid method is presented.
Keywords
VLSI; analogue integrated circuits; circuit optimisation; gradient methods; hardware description languages; hybrid simulation; integrated circuit design; integrated circuit modelling; numerical stability; VLSI design; Verilog-A in-loop simulation based modeling; analog behavioral model parameters; analog circuits; bottom-up extraction; global minima; gradient method; hybrid method; local minima; nonconvex optimization problem; nonlinear model; robust method; search method; test bench; transistor level netlist; Analog circuits; Artificial neural networks; Circuit simulation; Circuit testing; Convergence; Delay; Hardware design languages; MOSFETs; Robustness; Signal design; Behavioral Model; Gradient; Optimization; PSO; Parameter Extraction; Particle Swarm Optimization; Search; Verilog-A; Verilog-AMS;
fLanguage
English
Publisher
ieee
Conference_Titel
VLSI Design, 2010. VLSID '10. 23rd International Conference on
Conference_Location
Bangalore
ISSN
1063-9667
Print_ISBN
978-1-4244-5541-6
Type
conf
DOI
10.1109/VLSI.Design.2010.62
Filename
5401332
Link To Document