• DocumentCode
    3321482
  • Title

    An Efficient Method for Bottom-Up Extraction of Analog Behavioral Model Parameters

  • Author

    Pam, Srikanth ; Bhattacharya, A.K. ; Mukhopadhyay, S.

  • Author_Institution
    Dept. of Electr. Eng., Indian Inst. of Technol., Kharagpur, India
  • fYear
    2010
  • fDate
    3-7 Jan. 2010
  • Firstpage
    363
  • Lastpage
    368
  • Abstract
    This paper presents a fast, accurate and robust method for bottom-up extraction of analog behavioral model parameters from the corresponding transistor level netlists. The proposed Verilog-A in-loop simulation based modeling approach is generic and can estimate the parameters of the corresponding model of any given circuit using relevant test-benches, thus removing the need to implement structure based estimation tools for each circuit. The models are usually non-linear with respect to the parameters and often the optimization problem becomes nonconvex. A hybrid method based on co-operation and switching between search and gradient methods is proposed for achieving significantly faster convergence to the global minima even in presence of local minima in such non-convex cases. This method is applied by the authors to a wide variety of analog circuits, and is demonstrated in the paper using two distinctly different analog circuits. Simulation results comparing the model and transistor level netlist show that high level of accuracy can be achieved. The comparison of the search, gradient and the proposed hybrid method is presented.
  • Keywords
    VLSI; analogue integrated circuits; circuit optimisation; gradient methods; hardware description languages; hybrid simulation; integrated circuit design; integrated circuit modelling; numerical stability; VLSI design; Verilog-A in-loop simulation based modeling; analog behavioral model parameters; analog circuits; bottom-up extraction; global minima; gradient method; hybrid method; local minima; nonconvex optimization problem; nonlinear model; robust method; search method; test bench; transistor level netlist; Analog circuits; Artificial neural networks; Circuit simulation; Circuit testing; Convergence; Delay; Hardware design languages; MOSFETs; Robustness; Signal design; Behavioral Model; Gradient; Optimization; PSO; Parameter Extraction; Particle Swarm Optimization; Search; Verilog-A; Verilog-AMS;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    VLSI Design, 2010. VLSID '10. 23rd International Conference on
  • Conference_Location
    Bangalore
  • ISSN
    1063-9667
  • Print_ISBN
    978-1-4244-5541-6
  • Type

    conf

  • DOI
    10.1109/VLSI.Design.2010.62
  • Filename
    5401332