Title :
Statistical parameter measurement of unwanted emission from microwave ovens [digital mobile radio interference]
Author :
Yamanaka, Yukio ; Shinozuka, Takashi
Author_Institution :
Commun. Res. Lab., Minist. of Posts & Telecommun., Tokyo, Japan
Abstract :
Microwave ovens operated in the 2.45 GHz band emit broadband noise that might possibly interfere with digital mobile communication systems in 1-3 GHz bands when their terminals are used near the ovens. We therefore measured the basic properties of unwanted emissions from microwave ovens in both time domain and frequency domains, and found that out-of-band emission occurs when the magnetron oscillation is transient or unstable. We also measured the statistical distributions of the noise envelope at 1.9 GHz band-amplitude probability distribution, crossing rate distribution, pulse spacing distribution and pulse duration distribution-in order to obtain the information necessary for evaluating the degradation of the performance of communication systems
Keywords :
cellular radio; digital radio; electric noise measurement; frequency-domain analysis; land mobile radio; magnetrons; ovens; probability; radiofrequency interference; statistical analysis; time-domain analysis; 1 to 3 GHz; 2.45 GHz; amplitude probability distribution; broadband noise; cellular radio; communication system performance; crossing rate distribution; degradation; digital mobile communication systems; frequency domain; magnetron oscillation; microwave ovens; noise envelope; out-of-band emission; pulse duration distribution; pulse spacing distribution; statistical distributions; statistical parameter measurement; time domain; unwanted emission; Frequency domain analysis; Frequency measurement; Magnetic domains; Magnetic properties; Microwave measurements; Microwave ovens; Mobile communication; Noise measurement; Pulse measurements; Time measurement;
Conference_Titel :
Electromagnetic Compatibility, 1995. Symposium Record., 1995 IEEE International Symposium on
Conference_Location :
Atlanta, GA
Print_ISBN :
0-7803-3608-9
DOI :
10.1109/ISEMC.1995.523518