Title :
Comparing different approaches for model parameters identification in short time
Author :
Li, Linghan ; Kanning, Bastian ; Schenck, Christian ; Kuhfuss, Bernd
Author_Institution :
Bime | Bremen Inst. for Mech. Eng., Univ. of Bremen, Bremen, Germany
Abstract :
Model Parameter values of machine tools change during machining. An optimal process control needs precise knowledge of the actual parameter values. Three different algorithms are introduced to estimate the modal parameter values of system in a short time window with high resolution: least squares estimation (LSE), estimation of signal parameters via rotational invariance (ESPRIT) and orthogonal matching pursuits (OMP) algorithm. These algorithms are augmented with a sliding-window operation to reveal the actual system dynamic behavior at every time instance. This paper focuses on comparing the performance and the identification accuracy of the proposed methods and the influence of the applied window size and noise content using numerical examinations. The results show that the sliding-window LSE can estimate transient parameters accurately and suits realtime control processes.
Keywords :
iterative methods; least squares approximations; machine tools; machining; optimal control; parameter estimation; process control; real-time systems; time-frequency analysis; time-varying systems; ESPRIT; LSE; OMP algorithm; dynamic behavior; estimation of signal parameters via rotational invariance; least squares estimation; machine tools; machining; modal parameter value estimation; model parameter identification; optimal process control; orthogonal matching pursuits algorithm; real-time control processes; short time window; sliding-window operation; time varying systems; transient parameter estimation; Signal to noise ratio; Time frequency analysis; ESPRIT; least squares estimation; matching pursuits; modal parameter identification; short time analysis; sliding window operation;
Conference_Titel :
Signal Processing and Information Technology (ISSPIT), 2011 IEEE International Symposium on
Conference_Location :
Bilbao
Print_ISBN :
978-1-4673-0752-9
Electronic_ISBN :
978-1-4673-0751-2
DOI :
10.1109/ISSPIT.2011.6151600