• DocumentCode
    3321805
  • Title

    Multilayer molybdenum disulfide (MoS2) based tunnel transistor

  • Author

    Sanaullah, Muhammad ; Chowdhury, Masud H.

  • Author_Institution
    Comput. Sci. & Electr. Eng. Dept., Univ. of Missouri-Kansas City, Kansas City, MO, USA
  • fYear
    2015
  • fDate
    24-27 May 2015
  • Firstpage
    1929
  • Lastpage
    1932
  • Abstract
    Conventional and emerging field effect transistor (FET) technologies are approaching its fundamental physical and material limits imposed by the thermionic constraints or “Boltzmann tyranny” that is dependent on the thermal potential. There has been a surge of interest to introduce new devices, and replace silicon by emerging two-dimensional (2D) nanomaterials that can push the scaling and performance limits beyond the capabilities of MOSFET and silicon technologies. Here, we introduce the concept of a quantum mechanical band-to-band tunneling (BTBT) mechanism based devices with multilayer molybdenum disulfide (MoS2) as the channel material. BTBT mechanism has been investigated as a promising current injection mechanism in semiconductor device that can potentially overcome the adverse impacts of the short channel effects and the thermionic limits in MOSFETs. MoS2 is being considered as the new super-material for the post-silicon era. This paper also presents the analytical model of the tunneling current in the proposed device.
  • Keywords
    MOSFET; molybdenum compounds; multilayers; silicon; tunnel transistors; tunnelling; BTBT mechanism; Boltzmann tyranny; FET technology; MOSFET; MoS2; channel material; current injection mechanism; field effect transistor technology; multilayer molybdenum disulfide; quantum mechanical band-to-band tunneling; semiconductor device; short channel effect; silicon technology; thermionic constraint; tunnel transistor; tunneling current; two-dimensional nanomaterial; Logic gates; MOSFET; Nonhomogeneous media; Photonic band gap; Tunneling; Band-to-Band Tunneling; Multilayer MoS2; Quantum mechanics; Tunneling probability; WKB approximation;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Circuits and Systems (ISCAS), 2015 IEEE International Symposium on
  • Conference_Location
    Lisbon
  • Type

    conf

  • DOI
    10.1109/ISCAS.2015.7169050
  • Filename
    7169050