Title :
Training Linear Discriminant Analysis in Linear Time
Author :
Cai, Deng ; He, Xiaofei ; Han, Jiawei
Author_Institution :
Dept. of Comput. Sci., Univ. of Illinois at Urbana Champaign, Urbana, IL
Abstract :
Linear Discriminant Analysis (LDA) has been a popular method for extracting features which preserve class separability. It has been widely used in many fields of information processing, such as machine learning, data mining, information retrieval, and pattern recognition. However, the computation of LDA involves dense matrices eigen-decomposition which can be computationally expensive both in time and memory. Specifically, LDA has O(mnt + t3) time complexity and requires O(mn + mt + nt) memory, where m is the number of samples, n is the number of features and t = min (m,n). When both m and n are large, it is infeasible to apply LDA. In this paper, we propose a novel algorithm for discriminant analysis, called Spectral Regression Discriminant Analysis (SRDA). By using spectral graph analysis, SRDA casts discriminant analysis into a regression framework which facilitates both efficient computation and the use of regularization techniques. Our theoretical analysis shows that SRDA can be computed with O(ms) time and O(ms) memory, where s(les n) is the average number of non-zero features in each sample. Extensive experimental results on four real world data sets demonstrate the effectiveness and efficiency of our algorithm.
Keywords :
computational complexity; eigenvalues and eigenfunctions; graph theory; learning (artificial intelligence); matrix decomposition; regression analysis; data mining; dense matrices eigen-decomposition; feature extraction; information processing; information retrieval; linear discriminant analysis training; machine learning; pattern recognition; spectral graph analysis; spectral regression discriminant analysis; time complexity; Algorithm design and analysis; Data mining; Helium; Information processing; Information retrieval; Large-scale systems; Linear discriminant analysis; Pattern recognition; Scattering; Spectral analysis;
Conference_Titel :
Data Engineering, 2008. ICDE 2008. IEEE 24th International Conference on
Conference_Location :
Cancun
Print_ISBN :
978-1-4244-1836-7
Electronic_ISBN :
978-1-4244-1837-4
DOI :
10.1109/ICDE.2008.4497429