DocumentCode :
3321972
Title :
Parametric Fault Diagnosis of Nonlinear Analog Circuits Using Polynomial Coefficients
Author :
Sindia, Suraj ; Singh, Virendra ; Agrawal, Vishwani D.
Author_Institution :
Mixed Signal Syst. Group, Analog Devices Inc., Bangalore, India
fYear :
2010
fDate :
3-7 Jan. 2010
Firstpage :
288
Lastpage :
293
Abstract :
We propose a method for diagnosis of parametric faults in analog circuits using polynomial coefficients of the circuit model. As a sequel to our recent work, where circuit response is modeled as polynomial for uncovering parametric faults in nonlinear circuits, we propose diagnosis of such faults using sensitivity of coefficients of the estimated polynomial to circuit parameters. The proposed method requires no design for test hardware as might be added to the circuit by some other methods. The proposed method is illustrated for a benchmark elliptic filter. It is shown to uncover several parametric faults causing deviations as small as 5% from the nominal values.
Keywords :
analogue circuits; circuit reliability; elliptic filters; fault diagnosis; polynomials; circuit model; elliptic filter; nonlinear analog circuits; parametric fault diagnosis; polynomial coefficients; Analog circuits; Benchmark testing; Circuit faults; Circuit testing; Design methodology; Fault diagnosis; Filters; Hardware; Nonlinear circuits; Polynomials; fault diagnosis; nonlinear circuits; polynomial coefficients; sensitivity;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
VLSI Design, 2010. VLSID '10. 23rd International Conference on
Conference_Location :
Bangalore
ISSN :
1063-9667
Print_ISBN :
978-1-4244-5541-6
Type :
conf
DOI :
10.1109/VLSI.Design.2010.81
Filename :
5401354
Link To Document :
بازگشت