DocumentCode

3322120

Title

The following topics are dealt with: VLSI design; DG MOSFET; phoneme recognition system; Hamming distance; logic fault models; nano-CMOS SRAM; analytic FPGA; microfluidic biochips; nano-CMOS VCO; FinFET; ESL abstraction; video coding; CMOS inverters; RF-MEMS; adaptive clock; MIM capacitor ; RF SOI switch FET; hetero-material stepped gate; parametric fault diagnosis; MOS transistor model; word-length optimization; rotational interleaving; optical lithography; single electron transistors; IP protection and systems on chips.

Keywords

CMOS memory circuits; MOSFET; SRAM chips; VLSI; field programmable gate arrays; invertors; lab-on-a-chip; microfluidics; nanoelectronics; photolithography; semiconductor device models; silicon-on-insulator; single electron transistors; system-on-chip; video coding; voltage-controlled oscillators; DG MOSFET; ESL; FPGA; FinFET; Hamming distance; MIM capacitor; MOS transistor model; RF SOI switch FET; RF-MEMS; VLSI; adaptive clock; heteromaterial stepped gate; inverters; logic fault; microfluidic biochips; nanoCMOS SRAM; nanoCMOS VCO; optical lithography; parametric fault diagnosis; phoneme recognition; rotational interleaving; single electron transistors; systems on chip; video coding; word-length optimization;

fLanguage

English

Publisher

ieee

Conference_Titel

VLSI Design, 2010. VLSID '10. 23rd International Conference on

Conference_Location

Bangalore

ISSN

1063-9667

Print_ISBN

978-1-4244-5541-6

Type

conf

DOI

10.1109/VLSI.Design.2010.10

Filename

5401370

Table of contents

conf