Title :
Scattered fields by rough surfaces
Author :
Louza, Samya ; Audeh, N.F. ; Sandhu, Gormej
Author_Institution :
Dept. of Electr. & Comput. Eng., Alabama Univ., Huntsville, AL, USA
Abstract :
A number of surfaces having the same statistical properties are generated using one stochastic matrix. Additionally, for each surface obtained according to Markov chain, a corresponding Gaussian surface with the same mean and standard deviation is also generated. Utilizing ray-tracing, fields scattered by these surfaces are calculated and compared. It is shown that for rough surfaces generated according to the Markov chain and the Gaussian distribution, the field scatters in a wider range of angles (wider pattern) in proportion to the roughness. The number of the resulting scattering angles for the Gaussian surfaces is larger than those generated according to Markov chain. The reason is that the number of levels which a Markov surface can cover is limited by the order of the stochastic matrix. However, in the Gaussian case, the only limits are the mean and the standard deviation
Keywords :
electromagnetic field theory; electromagnetic wave scattering; matrix algebra; stochastic processes; EM fields; EM wave scattering; Gaussian surface; Markov chain; electromagnetic waves; ray-tracing; rough surfaces; scattered fields; scattering angles; statistical properties; stochastic matrix; Argon; Fresnel reflection; Gaussian distribution; Optical reflection; Piecewise linear techniques; Rayleigh scattering; Rough surfaces; Stochastic processes; Surface roughness; Surface waves;
Conference_Titel :
Southeastcon '89. Proceedings. Energy and Information Technologies in the Southeast., IEEE
Conference_Location :
Columbia, SC
DOI :
10.1109/SECON.1989.132453