DocumentCode :
3323468
Title :
Realistic 3D face modeling using feature-preserving surface registration
Author :
Kim, Yong Sun ; Lim, Hwasup ; Kang, Byongmin ; Choi, Ouk ; Lee, Keechang ; Kim, James D K ; Kim, Chang-Yeong
Author_Institution :
Samsung Adv. Inst. of Technol., South Korea
fYear :
2010
fDate :
26-29 Sept. 2010
Firstpage :
1821
Lastpage :
1824
Abstract :
This paper presents a novel algorithm for realistic 3D face modeling from a single pair of color and time-of-flight (TOF) depth images using a generic, deformable model. Most previous approaches have attempted to emphasize either facial feature or global shape consistency, resulting in either visually plausible or geometrically accurate models. In this paper, we introduce feature-preserving surface registration to achieve both reality and accuracy. The proposed algorithm takes advantages of both facial features from the color image and geometric information from the depth image in an iterative closest point (ICP) framework, where the non-rigid registration is achieved by iteratively minimizing the energy function consisting of feature distance term, surface distance term, and linear elasticity term. As demonstrated in the experimental results, the proposed algorithm builds the personalized 3D face model within a few seconds with high visual quality.
Keywords :
face recognition; feature extraction; image registration; iterative methods; solid modelling; 3D face modeling; deformable model; energy function; facial feature preserving surface registration; feature distance term; geometric information; geometrically accurate model; iterative closest point framework; linear elasticity term; nonrigid registration; shape consistency; surface distance term; time-of-flight depth image; visual quality; Adaptation model; Data models; Deformable models; Face; Facial features; Solid modeling; Three dimensional displays; 3D face modeling; elastic deformation; surface registration;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Image Processing (ICIP), 2010 17th IEEE International Conference on
Conference_Location :
Hong Kong
ISSN :
1522-4880
Print_ISBN :
978-1-4244-7992-4
Electronic_ISBN :
1522-4880
Type :
conf
DOI :
10.1109/ICIP.2010.5650893
Filename :
5650893
Link To Document :
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