DocumentCode
332358
Title
On the screening of the electric field at the cathode surface by an electron space charge at intense field emission
Author
Batrakov, A.V. ; Pegel, I.V. ; Proskurovsky, D.I.
Author_Institution
Inst. of High-Current Electron., Acad. of Sci., Tomsk, Russia
Volume
1
fYear
1998
fDate
17-21 Aug 1998
Firstpage
44
Abstract
The paper considers the effect of the space charge of emitted electrons on the electric field at the tip of a field emitter. To analyze this phenomenon, the Poisson equation was solved numerically for a spherical vacuum diode with a field emission cathode. The dependence of the actual electric field on the geometric electric field has been compared with the known approximate dependencies. Strong screening of the electric field at the cathode by the space charge of emitted electrons at fields over 5×107 V/cm is noted. Based on the obtained dependencies of the actual field on the geometric one and using the SuperSAM code, the field emission occurring in a Muller projector has been simulated. It has been shown that the “ring effect” appearing in field emission patterns can well be explained by the field emission from the peripheral regions of the field emitter. The current density distributions over the surface and in the bulk of the emitter have been analyzed
Keywords
cathodes; current density; electric fields; electron field emission; space charge; vacuum arcs; Muller projector; Poisson equation; SuperSAM code; cathode surface; current density distributions; electric field screening; electron space charge; field emission cathode; field emission patterns; field emitter tip; intense field emission; ring effect; spherical vacuum diode; Cathodes; Current density; Current-voltage characteristics; Diodes; Electron emission; Electrostatics; Levee; Poisson equations; Solid modeling; Space charge;
fLanguage
English
Publisher
ieee
Conference_Titel
Discharges and Electrical Insulation in Vacuum, 1998. Proceedings ISDEIV. XVIIIth International Symposium on
Conference_Location
Eindhoven
ISSN
1093-2941
Print_ISBN
0-7803-3953-3
Type
conf
DOI
10.1109/DEIV.1998.740569
Filename
740569
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