Title :
Sharing memory in multistage ATM switches
Author :
Basak, De Bashis ; Choudhury, Abhijit K. ; Hahne, Ellen L.
Author_Institution :
Ohio State Univ., Columbus, OH, USA
Abstract :
We study a multistage ATM switch in which shared-memory switching elements are arranged in a banyan topology. By “shared memory”, we mean that each switching element uses output queueing and shares its local cell buffer memory among all its output ports. We apply a buffer management technique called delayed pushout that was originally designed for multistage ATM switches with hierarchical topologies. Delayed pushout combines a pushout mechanism, for sharing memory efficiently among queues within the same switching element, and a backpressure mechanism, for sharing memory across switch stages. The backpressure component has a threshold to restrict the amount of sharing between stages. A synergy emerges when pushout, backpressure, and this threshold are all employed together. Using a computer simulation of the switch under bursty traffic, we study delayed pushout as well as several simpler pushout and backpressure schemes under a variety of traffic conditions. Of the five schemes we simulate, delayed pushout is the only one that performs well under all load conditions
Keywords :
asynchronous transfer mode; buffer storage; multistage interconnection networks; network topology; queueing theory; shared memory systems; telecommunication network management; telecommunication traffic; backpressure mechanism; banyan topology; buffer management technique; bursty traffic; delayed pushout; load conditions; local cell buffer memory; multistage ATM switches; output queueing; shared-memory switching elements; Asynchronous transfer mode; B-ISDN; Computational modeling; Computer architecture; Computer simulation; Delay; Intserv networks; Performance loss; Switches; Topology;
Conference_Titel :
Computer Communications and Networks, 1995. Proceedings., Fourth International Conference on
Conference_Location :
Las Vegas, NV
Print_ISBN :
0-8186-7180-7
DOI :
10.1109/ICCCN.1995.540155