Title :
Optimal Wireless Network Restoration under Jamming Attack
Author :
Jiang, Shanshan ; Xue, Yuan
Author_Institution :
Dept. of Electr. Eng. & Comput. Sci., Vanderbilt Univ., Nashville, TN, USA
Abstract :
Built upon a shared wireless medium, wireless network is particularly vulnerable to jamming attacks. The ability to recover from attacks and maintain an acceptable level of service degradation is a crucial aspect in the design of a wireless network. This paper investigates the network restoration solutions via joint traffic rerouting and channel re-assignment. In particular, we consider two strategies, namely global restoration and local restoration, which can support a range of tradeoffs between the restoration latency and network throughput after restoration. To quantitatively evaluate the impact of jamming attacks during and after restoration, we define two performance degradation indices, transient disruption index (TDI) and throughput degradation index (THI). We formulate the optimal network restoration schemes under these two strategies as linear programming problems and perform extensive performance evaluations to study the impact of various jamming scenarios in a multi-hop multi-channel wireless network.
Keywords :
jamming; linear programming; radio networks; telecommunication network routing; telecommunication traffic; wireless channels; channel reassignment; global restoration; jamming attack; linear programming; local restoration; multihop multichannel wireless network; network throughput; optimal wireless network restoration; restoration latency; service degradation; throughput degradation index; traffic rerouting; transient disruption index; Degradation; Delay; Jamming; Linear programming; Media Access Protocol; Spread spectrum communication; Telecommunication traffic; Throughput; Wireless application protocol; Wireless networks;
Conference_Titel :
Computer Communications and Networks, 2009. ICCCN 2009. Proceedings of 18th Internatonal Conference on
Conference_Location :
San Francisco, CA
Print_ISBN :
978-1-4244-4581-3
Electronic_ISBN :
1095-2055
DOI :
10.1109/ICCCN.2009.5235337