DocumentCode
3324440
Title
A novel CT perfusion protocol for quantitative contrast material mapping
Author
Brendel, Bernhard ; Roessl, Ewald ; Schlomka, Jens-Peter ; Thran, Axel ; Proksa, Roland
Author_Institution
Philips Res. Eur., Hamburg, Germany
fYear
2009
fDate
Oct. 24 2009-Nov. 1 2009
Firstpage
3021
Lastpage
3025
Abstract
In conventional CT-assisted perfusion imaging the quantitative assessment of diagnostically important parameters (e.g. cerebral blood flow and cerebral blood volume for brain perfusion) is based on the CT numbers in the acquired images. These CT numbers are distorted by a number of artifacts, especially by beam hardening. The distortion due to beam hardening can be avoided by acquiring the first images after injection of the contrast agent with a dual kV-scan, and decompose the projections into base component line integrals representing Compton scattering and photo effect. These base component line integrals can be used to estimate the contrast material line integrals from the projections of the following CT scans, done in a conventional manner. The contrast material line integrals can then be reconstructed to get a quantitative iodine map, from which perfusion parameters can be calculated more accurately. Based on simulated data, we show that this technique indeed has the potential to completely eliminate errors in the estimation of perfusion parameters due to beam hardening.
Keywords
biomedical materials; biomedical measurement; computerised tomography; haemorheology; medical signal processing; CT assisted perfusion imaging; CT perfusion protocol; Compton scattering; beam hardening; brain perfusion; cerebral blood flow; cerebral blood volume; computerised tomography; dual source voltage scan; photo-effect; quantitative contrast material mapping; Blood flow; Computed tomography; Data visualization; Estimation error; Europe; Image reconstruction; Nuclear and plasma sciences; Parameter estimation; Protocols; Scattering;
fLanguage
English
Publisher
ieee
Conference_Titel
Nuclear Science Symposium Conference Record (NSS/MIC), 2009 IEEE
Conference_Location
Orlando, FL
ISSN
1095-7863
Print_ISBN
978-1-4244-3961-4
Electronic_ISBN
1095-7863
Type
conf
DOI
10.1109/NSSMIC.2009.5401584
Filename
5401584
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