Title :
An optical Fourier/electronic neurocomputer automated inspection system
Author :
Glover, David E.
Author_Institution :
Global Holonetics Corp., Fairfield, IA, USA
Abstract :
An optical Fourier/electronic neurocomputer automated inspection system prototype is described. The system is composed to two modules: (1) a video-input optical/electronic Fourier feature extraction module, and (2) a PC/AT-based neurocomputer for feature signature (i.e., image) classification. Global shape and texture analysis, capable of discriminating relatively small and unpredictable image differences, is performed at speeds up to 15 images/s. The system performs 2-D image data compression by utilizing the attractive properties of coherent optical Fourier transform generation and optical feature sampling. Neural network multiclass pattern classifier algorithms (i.e., backpropagation and counterpropagation) are used to ensure system robustness in the presence of noisy, degraded, partial, or distorted images. It is expected that discrimination results can be used to track image-change trends for adaptive process control. Preliminary experimental results are presented.<>
Keywords :
Fourier transforms; computer vision; computerised pattern recognition; data compression; inspection; neural nets; 2D image data compression; PC/AT; automated inspection system; backpropagation; computer vision; computerised pattern recognition; counterpropagation; electronic neurocomputer; feature extraction; global shape analysis; multiclass pattern classifier; neural nets; optical Fourier; texture analysis; Data compression; Fourier transforms; Inspection; Machine vision; Neural networks; Pattern recognition;
Conference_Titel :
Neural Networks, 1988., IEEE International Conference on
Conference_Location :
San Diego, CA, USA
DOI :
10.1109/ICNN.1988.23892