Title :
Knowledge-based image management system for object identification
Author :
Sohn, Kwanghoon ; Kim, Jung H. ; Park, Eui H. ; Ntuen, C.A.
Author_Institution :
Dept. of Electr. & Comput. Eng., North Carolina State Univ., Raleigh, NC, USA
Abstract :
A prototype model of a knowledge-based image management system (KIMS), consisting of an image processing system and an expert system, was developed to demonstrate the feasibility of the automated inspection of a target object from X-ray images. It is shown that if the procedural knowledge and the declarative knowledge are known, rules can be developed which will be used to identify a target object from X-ray images. The authors report results for the various image analysis states of preprocessing, segmentation, feature extraction, understanding, and interpretation in KIMS with particular application to a regional representation scheme
Keywords :
computer vision; computerised pattern recognition; expert systems; KIMS; X-ray images; automated inspection; declarative knowledge; expert system; feature extraction; image analysis; image interpretation; image processing system; interpretation; knowledge-based image management system; preprocessing; procedural knowledge; regional representation scheme; segmentation; understanding; Artificial intelligence; Expert systems; Feature extraction; Filters; Gradient methods; Image analysis; Image edge detection; Image processing; Image segmentation; Knowledge management;
Conference_Titel :
Southeastcon '89. Proceedings. Energy and Information Technologies in the Southeast., IEEE
Conference_Location :
Columbia, SC
DOI :
10.1109/SECON.1989.132552
