DocumentCode
3324752
Title
A single-VDD half-clock-tolerant fine-grained dynamic voltage scaling pipeline
Author
Rong Zhou ; Kwen-Siong Chong ; Tong Lin ; Bah-Hwee Gwee ; Chang, Joseph S.
Author_Institution
Nanyang Technol. Univ., Singapore, Singapore
fYear
2015
fDate
24-27 May 2015
Firstpage
2589
Lastpage
2592
Abstract
We propose a novel dynamic voltage scaling (DVS) pipeline with three significant attributes. First, it features a fine-grained DVS which innately attempts to power most of the circuits therein at low voltages, and when the speed is beneath the requirement, to scale up the voltage. Second, it supports fast-transition DVS within one-and-a-half clock duration per operation, and its operation remains error-free during that duration; we define such attribute as half-clock-tolerant. Third, it consists of a single power source (single-VDD) which supports three voltage scales (1.2V, 0.8V and 0.5V) for power/speed tradeoffs, and has standardized 1.2V output to seamlessly interface with other proposed/conventional pipelines. These attributes are achieved due to the embodiment of a DVS power unit, asynchronous building blocks to control/synchronize the operation, a dual-rail critical path to innately detect the completion of the operation, and level shifters to standardize the output voltage. We demonstrate our proposed pipeline by designing a multiplier embodied in a Fast Fourier Transform processor (@65nm CMOS). We show that the multiplier based on our proposed pipeline, on average, is 1.94× more power-efficient than that based on a conventional pipeline.
Keywords
CMOS logic circuits; fast Fourier transforms; logic design; low-power electronics; multiplying circuits; CMOS; DVS pipeline; DVS power unit; fast Fourier transform processor; fast-transition DVS; fine-grained DVS; half-clock-tolerant dynamic voltage scaling pipeline; multiplier; one-and-a-half clock duration; power source; power-speed tradeoffs; size 65 nm; voltage 0.5 V; voltage 0.8 V; voltage 1.2 V; Clocks; Dynamic voltage scaling; Latches; Logic gates; Pipelines; Timing; Voltage control; asynchronous; critical path; dual-rail; dynamic voltage scaling; fast transition; fine-grained; timing-tolerant;
fLanguage
English
Publisher
ieee
Conference_Titel
Circuits and Systems (ISCAS), 2015 IEEE International Symposium on
Conference_Location
Lisbon
Type
conf
DOI
10.1109/ISCAS.2015.7169215
Filename
7169215
Link To Document