Title :
A single-VDD half-clock-tolerant fine-grained dynamic voltage scaling pipeline
Author :
Rong Zhou ; Kwen-Siong Chong ; Tong Lin ; Bah-Hwee Gwee ; Chang, Joseph S.
Author_Institution :
Nanyang Technol. Univ., Singapore, Singapore
Abstract :
We propose a novel dynamic voltage scaling (DVS) pipeline with three significant attributes. First, it features a fine-grained DVS which innately attempts to power most of the circuits therein at low voltages, and when the speed is beneath the requirement, to scale up the voltage. Second, it supports fast-transition DVS within one-and-a-half clock duration per operation, and its operation remains error-free during that duration; we define such attribute as half-clock-tolerant. Third, it consists of a single power source (single-VDD) which supports three voltage scales (1.2V, 0.8V and 0.5V) for power/speed tradeoffs, and has standardized 1.2V output to seamlessly interface with other proposed/conventional pipelines. These attributes are achieved due to the embodiment of a DVS power unit, asynchronous building blocks to control/synchronize the operation, a dual-rail critical path to innately detect the completion of the operation, and level shifters to standardize the output voltage. We demonstrate our proposed pipeline by designing a multiplier embodied in a Fast Fourier Transform processor (@65nm CMOS). We show that the multiplier based on our proposed pipeline, on average, is 1.94× more power-efficient than that based on a conventional pipeline.
Keywords :
CMOS logic circuits; fast Fourier transforms; logic design; low-power electronics; multiplying circuits; CMOS; DVS pipeline; DVS power unit; fast Fourier transform processor; fast-transition DVS; fine-grained DVS; half-clock-tolerant dynamic voltage scaling pipeline; multiplier; one-and-a-half clock duration; power source; power-speed tradeoffs; size 65 nm; voltage 0.5 V; voltage 0.8 V; voltage 1.2 V; Clocks; Dynamic voltage scaling; Latches; Logic gates; Pipelines; Timing; Voltage control; asynchronous; critical path; dual-rail; dynamic voltage scaling; fast transition; fine-grained; timing-tolerant;
Conference_Titel :
Circuits and Systems (ISCAS), 2015 IEEE International Symposium on
Conference_Location :
Lisbon
DOI :
10.1109/ISCAS.2015.7169215