DocumentCode
3324839
Title
Compact scan mask for 3-D connected components labeling
Author
Premchaiswadi, Wichian ; Sutheebanjard, Phaisarn
Author_Institution
Grad. Sch. of Inf. Technol., Siam Univ., Bangkok, Thailand
fYear
2012
fDate
12-13 Jan. 2012
Firstpage
145
Lastpage
149
Abstract
Connected component labeling is the underlying technique that is typically used in today´s digital image processing for both 2-dimensional and 3-dimensional images. This research analyzes the scan mask for connected components labeling and proposes a new scan mask for 3-dimensional connected components labeling operation (26-connectivity), in which the number of pixels to be inspected is reduced from 14 pixels to 8 pixels.
Keywords
image resolution; 3D connected components labeling operation; compact scan mask; digital image processing; pattern recognition; Algorithm design and analysis; Chaotic communication; Decision trees; Helium; Image processing; Labeling; Signal processing algorithms; connected components; image processing; labeling algorithm; pattern recognition; scan mask;
fLanguage
English
Publisher
ieee
Conference_Titel
ICT and Knowledge Engineering (ICT & Knowledge Engineering), 2011 9th International Conference on
Conference_Location
Bangkok
Print_ISBN
978-1-4577-2161-8
Type
conf
DOI
10.1109/ICTKE.2012.6152396
Filename
6152396
Link To Document