Title :
Compact scan mask for 3-D connected components labeling
Author :
Premchaiswadi, Wichian ; Sutheebanjard, Phaisarn
Author_Institution :
Grad. Sch. of Inf. Technol., Siam Univ., Bangkok, Thailand
Abstract :
Connected component labeling is the underlying technique that is typically used in today´s digital image processing for both 2-dimensional and 3-dimensional images. This research analyzes the scan mask for connected components labeling and proposes a new scan mask for 3-dimensional connected components labeling operation (26-connectivity), in which the number of pixels to be inspected is reduced from 14 pixels to 8 pixels.
Keywords :
image resolution; 3D connected components labeling operation; compact scan mask; digital image processing; pattern recognition; Algorithm design and analysis; Chaotic communication; Decision trees; Helium; Image processing; Labeling; Signal processing algorithms; connected components; image processing; labeling algorithm; pattern recognition; scan mask;
Conference_Titel :
ICT and Knowledge Engineering (ICT & Knowledge Engineering), 2011 9th International Conference on
Conference_Location :
Bangkok
Print_ISBN :
978-1-4577-2161-8
DOI :
10.1109/ICTKE.2012.6152396