• DocumentCode
    3325575
  • Title

    Study of interconnect vias by the discrete surface integral method

  • Author

    Shi, Hao ; Drewniak, James L.

  • Author_Institution
    Dept. of Electr. Eng., Missouri Univ., Rolla, MO, USA
  • fYear
    195
  • fDate
    14-18 Aug 195
  • Firstpage
    228
  • Lastpage
    233
  • Abstract
    A non-orthogonal time-domain full-wave solver, is developed based on the discrete surface integral (DSI) technique. Closed form expressions are derived for the coefficients used in the leap-frog computation scheme so that the DSI technique can be implemented as a generalised finite-difference procedure. This procedure is employed to investigate the propagation characteristics of a typical interconnect via in printed circuits. The numerically calculated scattering parameters show consistent behavior with measured results. A square via with equal area is also evaluated
  • Keywords
    S-parameters; finite difference time-domain analysis; integral equations; printed circuits; closed form expressions; coefficients; discrete surface integral; discrete surface integral method; finite-difference procedure; interconnect vias; measured results; nonorthogonal time-domain full-wave solver; printed circuits; propagation characteristics; scattering parameters; square via; Electromagnetic waveguides; Finite difference methods; Geometry; Integral equations; Integrated circuit interconnections; Maxwell equations; Printed circuits; Sampling methods; Time domain analysis; Transient analysis;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electromagnetic Compatibility, 1995. Symposium Record., 1995 IEEE International Symposium on
  • Conference_Location
    Atlanta, GA
  • Print_ISBN
    0-7803-3608-9
  • Type

    conf

  • DOI
    10.1109/ISEMC.1995.523552
  • Filename
    523552