Title :
Configuring arithmetic pattern generators and response compactors from the RT-modules of a circuit
Author :
Mayer, Frank ; Stroele, Albrecht P.
Author_Institution :
Inst. of Comput. Design & Fault Tolerance, Karlsruhe Univ., Germany
Abstract :
In recent years, accumulators have been shown to be efficient pattern generators and response compactors for built-in self-test. Many circuits contain modules which can be configured as accumulators just by controlling these modules adequately. This paper presents algorithms that find all possible accumulator configurations in a circuit and optimize the control of the accumulator test application or or inexpensive test control implementation
Keywords :
automatic test pattern generation; built-in self test; logic testing; RT-modules; accumulators; arithmetic pattern generators; built-in self-test; response compactors; test control implementation; Adders; Arithmetic; Automatic testing; Built-in self-test; Circuit testing; Clocks; Degradation; Digital arithmetic; Fault tolerance; Hardware; Libraries; Multiplexing; Registers; Shift registers; Signal generators; Test pattern generators;
Conference_Titel :
Test Symposium, 1998. ATS '98. Proceedings. Seventh Asian
Print_ISBN :
0-8186-8277-9
DOI :
10.1109/ATS.1998.741571
