DocumentCode :
332611
Title :
A high speed IDDQ sensor for low-voltage ICs
Author :
Hashizume, Masaki ; Miura, Yukiya ; Ichimiya, Masahiro ; Tamesada, Takeomi ; Kinoshita, Kozo
Author_Institution :
Tokushima Univ., Japan
fYear :
1998
fDate :
2-4 Dec 1998
Firstpage :
327
Lastpage :
331
Abstract :
A new high speed Built-In Current (BIC) sensor is proposed, which is applicable for IDDQ tests of low power ICs. The layout of the sensor is designed with CMOS 1.2 μm technology. By using this sensor, resistive bridging faults in a circuit, whose supply voltage is 3.3 V, can be detected at the test speed of 66.7 MHz
Keywords :
CMOS digital integrated circuits; electric current measurement; electric sensing devices; integrated circuit layout; integrated circuit testing; low-power electronics; 1.2 micron; 3.3 V; 66.7 MHz; CMOS technology; built-in current sensor; high speed IDDQ sensor; low power ICs; low-voltage ICs; resistive bridging faults; sensor layout; CMOS logic circuits; CMOS technology; Circuit faults; Circuit testing; Current measurement; Current supplies; Electrical fault detection; Integrated circuit testing; Logic testing; Low voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Test Symposium, 1998. ATS '98. Proceedings. Seventh Asian
ISSN :
1081-7735
Print_ISBN :
0-8186-8277-9
Type :
conf
DOI :
10.1109/ATS.1998.741634
Filename :
741634
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=332611
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