DocumentCode :
332613
Title :
Verification pattern generation for core-based design using port order fault model
Author :
Tung, Shing-Wu ; Jou, Jing-Yang
Author_Institution :
Comput. & Commun. Res. Lab., Ind. Technol. Res. Inst., Hsinchu, Taiwan
fYear :
1998
fDate :
2-4 Dec 1998
Firstpage :
402
Lastpage :
407
Abstract :
The lack of information about core´s internal structure means designers must rely solely on the test set distributed by the core provider. Sometimes the stuck at fault (SAF) model and automatic test pattern generation (ATPG) are used to generate test vectors for those pre-defined blocks. However, a SAF test set could waste lots of time to verify the pre-verified internal structure of the cores. Therefore, in order to reduce the core-based design verification time, we should adopt the connectivity-based port order fault (POF) model instead of the stuck at fault model. In this paper, we compare the POF model with the SAF model and propose a method that the POF test set for functional verification can be generated by using the SAF-based ATPG tools with proper assignment of don´t care terms in inputs
Keywords :
VLSI; application specific integrated circuits; automatic test pattern generation; fault diagnosis; logic testing; automatic test pattern generation; connectivity-based model; core-based design; don´t care terms; functional verification; port order fault model; pre-verified internal structure; stuck at fault; test vectors; verification pattern generation; Automatic test pattern generation; Automatic testing; Circuit faults; Circuit synthesis; Circuit testing; Design engineering; Electronic equipment testing; Logic arrays; Logic design; Logic testing; Moore´s Law; Test pattern generators; Timing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Test Symposium, 1998. ATS '98. Proceedings. Seventh Asian
ISSN :
1081-7735
Print_ISBN :
0-8186-8277-9
Type :
conf
DOI :
10.1109/ATS.1998.741647
Filename :
741647
Link To Document :
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