DocumentCode :
3326195
Title :
Integrating SAT with Multiway Decision Graphs for efficient model checking
Author :
Abed, Sa Ed ; Mohamed, Otmane Ait ; Yang, Zijiang ; Al Sammane, Ghiath
Author_Institution :
ECE Dept., Concordia Univ., Montreal, QC
fYear :
2007
fDate :
29-31 Dec. 2007
Firstpage :
129
Lastpage :
132
Abstract :
Multiway Decision Graphs (MDGs) are special decision diagrams that subsume Binary Decision Diagrams (BDDs) and extend them by a first-order formulae suitable for model checking of data path circuits. Satisfiability Checking (SAT) has emerged recently as an alternative for decision graphs. Their performance is less sensitive to the problem sizes and they do not suffer from state space explosion. In this paper, we propose a model checking methodology that allows to combine tightly MDGs and SAT. We use a rewriting based SAT solver to prune the transition relation of the circuits to produce a smaller one that is fed to the MDG model checker. We support our reduction methodology by experimental results executed on benchmark properties.
Keywords :
binary decision diagrams; binary decision diagrams; efficient model checking; multiway decision graphs; satisfiability checking; Binary decision diagrams; Boolean functions; Circuits; Data structures; Digital systems; Encoding; Explosions; Formal verification; Reachability analysis; State-space methods;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microelectronics, 2007. ICM 2007. Internatonal Conference on
Conference_Location :
Cairo
Print_ISBN :
978-1-4244-1846-6
Electronic_ISBN :
978-1-4244-1847-3
Type :
conf
DOI :
10.1109/ICM.2007.4497677
Filename :
4497677
Link To Document :
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