DocumentCode :
3326276
Title :
Improved SiC JBS rectifier based on P+ grids on P-well structure
Author :
Wanqing Xin ; Ruifeng Yue ; Yan Wang ; Li Zhang
Author_Institution :
Inst. of Microelectron., Tsinghua Univ., Beijing, China
fYear :
2013
fDate :
23-24 Dec. 2013
Firstpage :
852
Lastpage :
855
Abstract :
Compared with the common junction barrier Schottky (JBS) rectifier, a recently reported SiC JBS device with P+ grids on P-well (POP) exhibited an increasing breakdown voltage and Baliga´s figures of merit (4×Vbr2/Ron) due to a uniform electric field. To further enhance the performance, an improved POP structure is proposed. It features the upper part of the p-well sharing the same width with the p+ region to reduce the electric field crowding at the corner of that region. Detailed discussions about the device parameters combined with simulation results show that with the same photomask set and similar process flow, the BFOM of this device is 5% more than that of the original structure, and the breakdown voltage can be increased by 8.5%.
Keywords :
Schottky diodes; semiconductor device breakdown; silicon compounds; solid-state rectifiers; wide band gap semiconductors; Baliga´s figures of merit; SiC; SiC JBS rectifier; breakdown voltage; p+ grids; p-well structure; uniform electric field; Buffer layers; Electric fields; Fabrication; Junctions; Rectifiers; Schottky diodes; Silicon carbide; BFOM; JBS rectifier; SiC; breakdown voltage; on-state resistance; p-well;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Instrumentation and Measurement, Sensor Network and Automation (IMSNA), 2013 2nd International Symposium on
Conference_Location :
Toronto, ON
Type :
conf
DOI :
10.1109/IMSNA.2013.6743411
Filename :
6743411
Link To Document :
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