• DocumentCode
    3326276
  • Title

    Improved SiC JBS rectifier based on P+ grids on P-well structure

  • Author

    Wanqing Xin ; Ruifeng Yue ; Yan Wang ; Li Zhang

  • Author_Institution
    Inst. of Microelectron., Tsinghua Univ., Beijing, China
  • fYear
    2013
  • fDate
    23-24 Dec. 2013
  • Firstpage
    852
  • Lastpage
    855
  • Abstract
    Compared with the common junction barrier Schottky (JBS) rectifier, a recently reported SiC JBS device with P+ grids on P-well (POP) exhibited an increasing breakdown voltage and Baliga´s figures of merit (4×Vbr2/Ron) due to a uniform electric field. To further enhance the performance, an improved POP structure is proposed. It features the upper part of the p-well sharing the same width with the p+ region to reduce the electric field crowding at the corner of that region. Detailed discussions about the device parameters combined with simulation results show that with the same photomask set and similar process flow, the BFOM of this device is 5% more than that of the original structure, and the breakdown voltage can be increased by 8.5%.
  • Keywords
    Schottky diodes; semiconductor device breakdown; silicon compounds; solid-state rectifiers; wide band gap semiconductors; Baliga´s figures of merit; SiC; SiC JBS rectifier; breakdown voltage; p+ grids; p-well structure; uniform electric field; Buffer layers; Electric fields; Fabrication; Junctions; Rectifiers; Schottky diodes; Silicon carbide; BFOM; JBS rectifier; SiC; breakdown voltage; on-state resistance; p-well;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Instrumentation and Measurement, Sensor Network and Automation (IMSNA), 2013 2nd International Symposium on
  • Conference_Location
    Toronto, ON
  • Type

    conf

  • DOI
    10.1109/IMSNA.2013.6743411
  • Filename
    6743411