DocumentCode
3326458
Title
Imaging performance measurements of SiliSPECT
Author
McDonald, Benjamin S. ; Shokouhi, Sepideh ; Peterson, Todd E.
Author_Institution
Dept. of Phys. & Astron., Vanderbilt Univ., Nashville, TN, USA
fYear
2009
fDate
Oct. 24 2009-Nov. 1 2009
Firstpage
3155
Lastpage
3158
Abstract
SiliSPECT, a multi-pinhole, multi-detector SPECT system, was designed to image targeted-regions of rodents at sub-300 ¿m resolution with motionless data acquisition and a special reconstruction method. High spatial resolution is achieved with thick silicon double-sided strip detectors (DSSDs) and 250 ¿m pinhole apertures. Each of the two heads contains two stacked DSSDs, which improves total detection efficiency. The stacked detector, multi-pinhole aperture configuration also permits experimental validation of simulated synthetic collimator image reconstruction. SiliSPECT was assembled and operates stably with forced air cooling. Performance measurements, including intrinsic detection efficiency, sensitivity, and dead time were made. To reconstruct tomographic images with a calculated system matrix requires accurate estimation of geometric calibration parameters. We present details of our approach for determining these parameters.
Keywords
brain; calibration; collimators; image reconstruction; image resolution; medical image processing; neurophysiology; single photon emission computed tomography; SiliSPECT; forced air cooling; geometric calibration parameters; heads; intrinsic detection efficiency; motionless data acquisition; multidetector SPECT system; multipinhole SPECT system; pinhole apertures; simulated synthetic collimator image reconstruction; size 250 mum; size 300 mum; spatial resolution; special reconstruction method; thick silicon double-sided strip detectors; Data acquisition; Decision support systems; Detectors; High-resolution imaging; Image reconstruction; Image resolution; Measurement; Reconstruction algorithms; Rodents; Spatial resolution;
fLanguage
English
Publisher
ieee
Conference_Titel
Nuclear Science Symposium Conference Record (NSS/MIC), 2009 IEEE
Conference_Location
Orlando, FL
ISSN
1095-7863
Print_ISBN
978-1-4244-3961-4
Electronic_ISBN
1095-7863
Type
conf
DOI
10.1109/NSSMIC.2009.5401691
Filename
5401691
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