DocumentCode
332648
Title
Digest Report of the Investigation Committee on Evaluation Methods of High Reliability Insulation Technology for Electronic Equipment
Author
Tsukui, T. ; Yamano, Y. ; Shutoh, K. ; Nonogaki, M.
Author_Institution
Science University of Tokyo
fYear
1998
fDate
27-30 Sep 1998
Firstpage
829
Lastpage
829
Keywords
Capacitance; Capacitance-voltage characteristics; Character generation; Chemical analysis; Chemical products; Dielectrics and electrical insulation; Microscopy; Tellurium; Test pattern generators; Testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Electrical Insulating Materials, 1998. Proceedings of 1998 International Symposium on
Print_ISBN
4-88686-050-8
Type
conf
DOI
10.1109/ISEIM.1998.741904
Filename
741904
Link To Document