DocumentCode :
332648
Title :
Digest Report of the Investigation Committee on Evaluation Methods of High Reliability Insulation Technology for Electronic Equipment
Author :
Tsukui, T. ; Yamano, Y. ; Shutoh, K. ; Nonogaki, M.
Author_Institution :
Science University of Tokyo
fYear :
1998
fDate :
27-30 Sep 1998
Firstpage :
829
Lastpage :
829
Keywords :
Capacitance; Capacitance-voltage characteristics; Character generation; Chemical analysis; Chemical products; Dielectrics and electrical insulation; Microscopy; Tellurium; Test pattern generators; Testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electrical Insulating Materials, 1998. Proceedings of 1998 International Symposium on
Print_ISBN :
4-88686-050-8
Type :
conf
DOI :
10.1109/ISEIM.1998.741904
Filename :
741904
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=332648
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