DocumentCode :
3326606
Title :
Diffusion furnace control using a learning control method
Author :
Asahi, I. ; Ito, A. ; Yamada, S. ; Abe, A. ; Furuta, K. ; Yamakita, M.
Author_Institution :
Ohkura Electric Co. Ltd., Saitama, Japan
fYear :
1991
fDate :
28 Oct-1 Nov 1991
Firstpage :
1941
Abstract :
A learning control method is applied to a semiconductor diffusion furnace. In the proposed learning controller, an adjustment signal besides a virtual reference has been employed and it is shown that the signal improves the response in the high-frequency spectra. It is also found that the control method is effective for disturbances due to both loading a wafer boat and burning operations. Experimental results show that the proposed method is very effective for high-performance temperature control and gives errors five times smaller than associated with a conventional LQ controller
Keywords :
furnaces; learning systems; process control; semiconductor device manufacture; temperature control; burning; high-frequency spectra; high-performance temperature control; learning control; process control; semiconductor devices; semiconductor diffusion furnace; wafer boat; Control engineering; Control systems; Error correction; Frequency; Furnaces; Semiconductor devices; Semiconductor impurities; Signal generators; Silicon; Temperature control;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Industrial Electronics, Control and Instrumentation, 1991. Proceedings. IECON '91., 1991 International Conference on
Conference_Location :
Kobe
Print_ISBN :
0-87942-688-8
Type :
conf
DOI :
10.1109/IECON.1991.239045
Filename :
239045
Link To Document :
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