• DocumentCode
    3326606
  • Title

    Diffusion furnace control using a learning control method

  • Author

    Asahi, I. ; Ito, A. ; Yamada, S. ; Abe, A. ; Furuta, K. ; Yamakita, M.

  • Author_Institution
    Ohkura Electric Co. Ltd., Saitama, Japan
  • fYear
    1991
  • fDate
    28 Oct-1 Nov 1991
  • Firstpage
    1941
  • Abstract
    A learning control method is applied to a semiconductor diffusion furnace. In the proposed learning controller, an adjustment signal besides a virtual reference has been employed and it is shown that the signal improves the response in the high-frequency spectra. It is also found that the control method is effective for disturbances due to both loading a wafer boat and burning operations. Experimental results show that the proposed method is very effective for high-performance temperature control and gives errors five times smaller than associated with a conventional LQ controller
  • Keywords
    furnaces; learning systems; process control; semiconductor device manufacture; temperature control; burning; high-frequency spectra; high-performance temperature control; learning control; process control; semiconductor devices; semiconductor diffusion furnace; wafer boat; Control engineering; Control systems; Error correction; Frequency; Furnaces; Semiconductor devices; Semiconductor impurities; Signal generators; Silicon; Temperature control;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Industrial Electronics, Control and Instrumentation, 1991. Proceedings. IECON '91., 1991 International Conference on
  • Conference_Location
    Kobe
  • Print_ISBN
    0-87942-688-8
  • Type

    conf

  • DOI
    10.1109/IECON.1991.239045
  • Filename
    239045