Title :
Models for low-macroscopic-field electron emission
Author :
Forbes, Richard G.
Author_Institution :
Sch. of Electronics, Comput. & Maths, Univ. of Surrey, Guildford, UK
Abstract :
Summary form only given. Low-macroscopic-field (LMF) electron emission occurs primarily because electrical nanostructure in a thin dielectric film generates local field enhancement at its surface, and facilitates electrons tunnelling. A classification of alternative structures that allow LMF emission is made using "Conductor/Dielectric/Vacuum (CDV)" terminology. Emission current may be controlled by one of several system components; hence different control regimes may exist. Some possible transitions are classified. An outline microscopic theory is presented for the transition from front-surface-barrier control to dielectric-conduction-channel control, for a C-D-V system
Keywords :
dielectric thin films; electron field emission; tunnelling; conductor/dielectric/vacuum system; dielectric thin film; dielectric-conduction-channel control; electrical nanostructure; electron tunnelling; front-surface-barrier control; low-macroscopic-field electron emission; Assembly; Conductors; Control systems; Dielectric films; Dielectric materials; Electron emission; Microscopy; Physics; Terminology; Tunneling;
Conference_Titel :
Vacuum Microelectronics Conference, 2001. IVMC 2001. Proceedings of the 14th International
Conference_Location :
Davis, CA
Print_ISBN :
0-7803-7197-6
DOI :
10.1109/IVMC.2001.939658
