Title :
Dynamic fault collapsing and diagnostic test pattern generation for sequential circuits
Author :
Boppana, V. ; Fuchs, I.K.
Author_Institution :
Fujitsu Labs. of America Inc., Sunnyvale, CA, USA
Abstract :
We present results for significantly improving the performance of sequential circuit diagnostic test pattern generation (DATPG). Our improvements are achieved by developing results that permit dynamic, fully functional collapsing of candidate faults. Fault collapsing permits the organization of faults into disjoint partitions based on the indistinguishability relation. These results are used to develop a diagnostic test pattern generation algorithm that has the same order of complexity as that of detection oriented test generation (ATPG). Techniques to identify untestable faults, based on exploiting indistinguishability identification, are also presented. Experimental results are presented on the ISCAS 89 benchmark circuits.
Keywords :
automatic test pattern generation; fault diagnosis; logic CAD; logic partitioning; logic testing; sequential circuits; ATPG; DATPG; ISCAS 89 benchmark circuits; automatic test pattern generation; candidate faults; detection oriented test generation; diagnostic test pattern generation algorithm; disjoint partitions; dynamic fault collapsing; fully functional collapsing; indistinguishability identification; indistinguishability relation; order of complexity; sequential circuit diagnostic test pattern generation; untestable faults; Automatic test pattern generation; Circuit faults; Circuit testing; Combinational circuits; Electrical fault detection; Fault diagnosis; Partitioning algorithms; Sequential analysis; Sequential circuits; Test pattern generators;
Conference_Titel :
Computer-Aided Design, 1998. ICCAD 98. Digest of Technical Papers. 1998 IEEE/ACM International Conference on
Conference_Location :
San Jose, CA, USA
Print_ISBN :
1-58113-008-2
DOI :
10.1109/ICCAD.1998.144259
