• DocumentCode
    332700
  • Title

    Determination of worst-case aggressor alignment for delay calculation

  • Author

    Gross, P.D. ; Arunachalam, R. ; Rajagopal, K. ; Pileggi, L.T.

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Carnegie Mellon Univ., Pittsburgh, PA, USA
  • fYear
    1998
  • fDate
    8-12 Nov. 1998
  • Firstpage
    212
  • Lastpage
    219
  • Abstract
    Increases in delay due to coupling can have a dramatic impact on IC performance for deep submicron technologies. To achieve maximum performance there is a need for analyzing logic stages with large complex coupled interconnects. In timing analysis, the worst case delay of gates along a critical path must include the effect of noise due to switching of nearby aggressor gates. We propose a new waveform iteration strategy to compute the delay in the presence of coupling and to align aggressor inputs to determine the worst case victim delay. We demonstrate the application of our methodology at both the transistor level and cell level. In addition, we prove that the waveforms generated in our methodology converge under typical timing analysis conditions.
  • Keywords
    circuit analysis computing; integrated circuit design; logic CAD; logic gates; waveform analysis; IC performance; aggressor gates; aggressor inputs; cell level; critical path; deep submicron technologies; delay calculation; gates; large complex coupled interconnects; logic stages; timing analysis conditions; transistor level; waveform generation; waveform iteration strategy; worst case aggressor alignment; worst case delay; worst case victim delay; Capacitance; Crosstalk; Delay effects; Integrated circuit noise; Logic; Permission; Propagation delay; Semiconductor device noise; Switches; Timing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Computer-Aided Design, 1998. ICCAD 98. Digest of Technical Papers. 1998 IEEE/ACM International Conference on
  • Conference_Location
    San Jose, CA, USA
  • Print_ISBN
    1-58113-008-2
  • Type

    conf

  • DOI
    10.1109/ICCAD.1998.144269
  • Filename
    742875