DocumentCode :
3327032
Title :
Tests with different IEC801.2 ESD simulators have different results depending on product sensitivities
Author :
Hall, Ken ; McCarthy, Darren
Author_Institution :
Hewlett-Packard Co., Roseville, CA, USA
fYear :
195
fDate :
14-18 Aug 195
Firstpage :
280
Lastpage :
284
Abstract :
Electrostatic discharge simulators, (ESD), from different manufacturers yield different results while testing products to the same standard, IEC801-2 (1991). Several different ESD simulators were used to illustrate the different results that can be obtained. All the ESD simulators complied with the IEC801-2 (1991) contact discharge pulse calibration requirements when tested with a 1 GHz oscilloscope. Two products used met the performance requirements with at least one of the simulators, but failed with others. Furthermore, variances of greater than 4:1 where experienced in the testing. The paper discusses the two following results: (A) with an Hewlett-Packard 2 GHz single-shot digitizing oscilloscope and a 1.2 GHz low pass filter the high frequency differences between the ESD simulators are shown; (B) with an HP 2 GHz digitizing oscilloscope and a Barth TEM horn antenna, it is shown that differences in the radiated field from different simulators exists. If the IEC standard specifies the events and methods of measurement more rigorously, ESD simulators from different manufacturers would perform the same. Unfortunately, the radiated fields methods of measurement and performance are completely unspecified and different
Keywords :
calibration; digital storage oscilloscopes; electromagnetic interference; electrostatic discharge; horn antennas; low-pass filters; measurement standards; simulation; 1.2 GHz; 2 GHz; Barth TEM horn antenna; Hewlett-Packard digitizing oscilloscope; IEC standard; IEC801.2 ESD simulator; contact discharge pulse calibration; electrostatic discharge simulators; low pass filter; measurement methods; performance requirements; product sensitivities; products testing; radiated fields methods; Antenna measurements; Calibration; Electrostatic discharge; Frequency; Horn antennas; IEC standards; Low pass filters; Oscilloscopes; Testing; Virtual manufacturing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electromagnetic Compatibility, 1995. Symposium Record., 1995 IEEE International Symposium on
Conference_Location :
Atlanta, GA
Print_ISBN :
0-7803-3608-9
Type :
conf
DOI :
10.1109/ISEMC.1995.523563
Filename :
523563
Link To Document :
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