DocumentCode :
332711
Title :
An efficient DC root solving algorithm with guaranteed convergence for analog integrated CMOS circuits
Author :
Leyn, F. ; Gielen, G. ; Sansen, W.
Author_Institution :
Katholieke Univ., Leuven, Belgium
fYear :
1998
fDate :
8-12 Nov. 1998
Firstpage :
304
Lastpage :
307
Abstract :
The paper describes a new DC modeling methodology applicable to CMOS integrated circuits. It is named operating point driven DC formulation because the operating point is specified directly, and the device dimensions W and L are determined out of it. With other methods, one specifies the device dimensions W and L and determines the operating point. Our method is important for manual design because it allows the designer to reason in terms of voltages and currents and relieves him from the burden of determining device sizes. The algorithm is guaranteed to converge, and is computationally efficient, which allows interactive design space exploration using optimization based sizing. A design plan used in optimization based sizing consists for the largest part out of solving the DC part. Speeding up the DC part with a computationally efficient algorithm that allows parallelisation, results in a boost of optimization speed.
Keywords :
CMOS analogue integrated circuits; circuit analysis computing; interactive systems; CMOS integrated circuits; DC modeling methodology; DC root solving algorithm; analog integrated CMOS circuits; currents; design plan; device dimensions; device sizes; guaranteed convergence; interactive design space exploration; manual design; operating point driven DC formulation; optimization based sizing; optimization speed; parallelisation; voltages; Algorithm design and analysis; CMOS analog integrated circuits; CMOS integrated circuits; Concurrent computing; Convergence; Design optimization; Integrated circuit modeling; Semiconductor device modeling; Space exploration; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Computer-Aided Design, 1998. ICCAD 98. Digest of Technical Papers. 1998 IEEE/ACM International Conference on
Conference_Location :
San Jose, CA, USA
Print_ISBN :
1-58113-008-2
Type :
conf
DOI :
10.1109/ICCAD.1998.144282
Filename :
742888
Link To Document :
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