A methodology for low cost electromagnetic compatibility testing at the prototype stage of development

The paper presents a low cost methodology for assessing electromagnetic compatibility of newly developed printed circuit assemblies without the need for exotic chambers and test equipment. Included in these procedures are a variety of “E” field probes, instructions for building these probes, and the test equipment needed to be successful. Correlation data between formal test procedures using an anechoic chamber and this procedure are included as part of the paper