DocumentCode :
3327456
Title :
High-precision time-to-digital converter in a FPGA device
Author :
Aloisio, A. ; Branchini, P. ; Giordano, R. ; Izzo, V. ; Loffredo, S.
Author_Institution :
Dipt. di Sci. Fis., Univ. di Napoli Federico II, Naples, Italy
fYear :
2009
fDate :
Oct. 24 2009-Nov. 1 2009
Firstpage :
290
Lastpage :
294
Abstract :
The construction and design process of a high-resolution time-interval measuring system implemented in a SRAM-based FPGA device is discussed in this paper. The TDC can increase the precision on the measurement by interpolating time within the system clock cycle. A two step phase interpolation has been constructed, one based on the phase information delivered by the VIRTEX-5 Digital Clock Manager (DCM) and thus providing a fine time, a second level phase interpolation was based on carry lines thus delivering an hyper fine time measurement. We have designed and built a PCB hosting a Virtex-5 Xilinx FPGA. The board we have designed provides 7 TDC channels. The number of channels turns out to be limited by the number of input connectors inserted on the board and not on the code density on the FPGA. The range is in principle slightly longer than 1 day (127941 sec), but our tests are preliminary and have been made on intervals less than 20 ¿sec. In this range we have measured a resolution which is better than 55 psec for the time interval on a single channel in single and multi-hit mode.
Keywords :
field programmable gate arrays; interpolation; nuclear electronics; PCB; SRAM-based FPGA device; Virtex-5 Xilinx FPGA; Virtex-5 digital clock manager; high-precision time-to-digital converter; high-resolution time-interval measuring system; multihit mode; single hit mode; time interpolation; two step phase interpolation; Clocks; Counting circuits; Delay lines; Field programmable gate arrays; Frequency; Interpolation; Oscillators; Performance evaluation; Testing; Time measurement; FPGA; TDC;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Nuclear Science Symposium Conference Record (NSS/MIC), 2009 IEEE
Conference_Location :
Orlando, FL
ISSN :
1095-7863
Print_ISBN :
978-1-4244-3961-4
Electronic_ISBN :
1095-7863
Type :
conf
DOI :
10.1109/NSSMIC.2009.5401744
Filename :
5401744
Link To Document :
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