Title :
Degradation mechanism of low voltage cathodoluminescence of ZnS:Ag,Cl phosphors screen under the panel sealing process
Author :
Park, Zin-Min ; Jeon, Duk Young ; Cha, Seung Nam ; Jin, Yong Wan ; Kim, Jong Min
Author_Institution :
Dept. of Mater. Sci. & Eng., Korea Adv. Inst. of Sci. & Tech., Taejon, South Korea
Abstract :
Degradation characteristics of low voltage cathodoluminescence (CL) of ZnS:Ag,Cl phosphor screen under the environment of panel sealing process was investigated. Auger electron spectroscopy (AES) and CL measurements showed that the compositional changes occur in the surface layer of phosphor screen
Keywords :
Auger electron spectra; cathodoluminescence; chlorine; fluorescent screens; phosphors; seals (stoppers); silver; surface composition; zinc compounds; Auger electron spectroscopy; ZnS:Ag,Cl; ZnS:Ag,Cl phosphor screen; degradation characteristics; low-voltage cathodoluminescence; panel sealing process; surface composition; Degradation; Displays; Electron beams; Heat treatment; Low voltage; Phosphors; Sealing materials; Spectroscopy; Surface treatment; Temperature;
Conference_Titel :
Vacuum Microelectronics Conference, 2001. IVMC 2001. Proceedings of the 14th International
Conference_Location :
Davis, CA
Print_ISBN :
0-7803-7197-6
DOI :
10.1109/IVMC.2001.939721
