DocumentCode
3328016
Title
Bistatic scattering, backscattering and emissivities of randomly rough soil surfaces at L band based on numerical solutions of Maxwell equations of 3 Dimensional simulations
Author
Huang, Shaowu ; Tsang, Leung
Author_Institution
Dept. of Electr. Eng., Univ. of Washington, Seattle, WA, USA
fYear
2010
fDate
25-30 July 2010
Firstpage
1390
Lastpage
1393
Abstract
In this paper, we used NMM3D (Numerical Maxwell Model of 3 Dimensional simulations) to study the full wave 3 dimensional scattering of random soil surfaces. In 3D simulations, the height function z=f(x,y) of the rough surfaces vary in both two horizontal directions. Several hundreds of cases are simulated by varying incident angles, surface roughness and soil permittivities. The incident angles vary from 20° to 50°. The coherent/incoherent bistatic coefficients, backscattering coefficients, and emissivities are computed. The results are compared with empirical models and analytical methods. The backscattering coefficients are compared with measurement data and are found to be in good agreement. Based on the several hundreds of computed case, interpolation tables are made for the full range of parameters that can be directly applied to L band active and passive microwave remote sensing of soil moisture, such as the SMAP Mission and the SMOS Mission.
Keywords
Maxwell equations; remote sensing; soil; L band active microwave remote sensing; L band passive microwave remote sensing; Maxwell equations; NMM3D; SMAP Mission; SMOS Mission; backscattering coefficients; bistatic scattering; coherent-incoherent bistatic coefficients; emissivity; height function; incident angles; numerical Maxwell model of 3 dimensional simulations; random soil surfaces; soil moisture; soil permittivities; Mathematical model; Numerical models; Rough surfaces; Scattering; Soil; Surface roughness; Surface waves; EM scattering; NMM3D; microwave remote sensing; rough surface; soil moisture;
fLanguage
English
Publisher
ieee
Conference_Titel
Geoscience and Remote Sensing Symposium (IGARSS), 2010 IEEE International
Conference_Location
Honolulu, HI
ISSN
2153-6996
Print_ISBN
978-1-4244-9565-8
Electronic_ISBN
2153-6996
Type
conf
DOI
10.1109/IGARSS.2010.5651152
Filename
5651152
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