DocumentCode :
3328125
Title :
A full-system simulation chain for computed tomography scanners
Author :
Kappler, Steffen ; Niederlöhner, Daniel ; Wirth, Stefan ; Stierstorfer, Karl
Author_Institution :
Siemens Healthcare, Forchheim, Germany
fYear :
2009
fDate :
Oct. 24 2009-Nov. 1 2009
Firstpage :
3433
Lastpage :
3436
Abstract :
Image quality and dose reduction are fields of continuous research and development in Clinical Computed Tomography. This requires screening new approaches such as innovative detector technologies, spectral filtering, data compression or novel CT algorithms. Resulting image quality properties like sharpness, image noise, homogeneity and image artifacts need to be assessed and compared to state-of-the-art solutions. We present a chain of spectral simulation tools covering full CT-systems with X-ray source, filtering, patient or phantom interaction, energy integrating or quantum counting detectors, data processing and CT image reconstruction. Modelling of the relevant physics processes is described in detail for each of the stages involved. We present CT images from simulated scans. A quantitative analysis shows excellent agreement with data from a real CT scanner. Finally, we outline a technology comparison study as typical application example of the presented simulation tools.
Keywords :
computerised tomography; data compression; image coding; image reconstruction; medical image processing; clinical computed tomography; computed tomography scanners; data compression; image artifacts; image homogeneity; image noise; image quality; image sharpness; phantom; spectral filtering; Computational modeling; Computed tomography; Data compression; Detectors; Filtering algorithms; Image quality; Imaging phantoms; Research and development; X-ray detection; X-ray imaging;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Nuclear Science Symposium Conference Record (NSS/MIC), 2009 IEEE
Conference_Location :
Orlando, FL
ISSN :
1095-7863
Print_ISBN :
978-1-4244-3961-4
Electronic_ISBN :
1095-7863
Type :
conf
DOI :
10.1109/NSSMIC.2009.5401779
Filename :
5401779
Link To Document :
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