• DocumentCode
    3328127
  • Title

    Extending QuickSilver™ electronics for PET insert integration

  • Author

    Hu, Dongming ; Siegel, Stefan B. ; Wu, Heyu ; Wen, Jie ; Ravindranath, Bosky ; Tai, Yuan-Chuan

  • Author_Institution
    Siemens Mol. Imaging, Knoxville, TN, USA
  • fYear
    2011
  • fDate
    23-29 Oct. 2011
  • Firstpage
    3247
  • Lastpage
    3249
  • Abstract
    The unique, circular topology of the QuickSilver electronics of the Siemens Inveon PET scanner distributes the coincidence event matching, as opposed to the traditional star structure with a centralized coincidence processor. This architecture provides a means to extend or integrate QuickSilver based systems without hardware modification. This paper reports on integrating a small, high-resolution PET insert, developed at Washington University (WU) in St. Louis, into a Siemens Inveon PET. The detectors in WU PET insert are equipped with LSO arrays coupled to Multi-Pixel Photon Counters (MPPC). Scintillation events detected by PET insert detectors are processed by a set of independent QuickSilver electronics. By placing this insert within the Inveon PET, one can achieve sub-millimeter resolution. By rerouting RocketIO (RIO, Xilinx standard) cables and modifying Field Programmable Gate Array (FPGA) firmware, the two PET systems can be integrated in such a manner as to create coincident pairs within the insert ring, within the original Inveon ring, and between the two rings.
  • Keywords
    biomedical electronics; field programmable gate arrays; positron emission tomography; scintillation; silver; topology; Ag; LSO arrays; PET insert detectors; PET insert integration; RocketIO cables; Siemens Inveon PET scanner; centralized coincidence processor; circular topology; field programmable gate array firmware; multipixel photon counters; quicksilver electronics; scintillation; Clocks; Positron emission tomography;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Nuclear Science Symposium and Medical Imaging Conference (NSS/MIC), 2011 IEEE
  • Conference_Location
    Valencia
  • ISSN
    1082-3654
  • Print_ISBN
    978-1-4673-0118-3
  • Type

    conf

  • DOI
    10.1109/NSSMIC.2011.6152582
  • Filename
    6152582