DocumentCode :
332817
Title :
Reduction of errors due to source and meter in the nonlinearity test
Author :
Hsieh, S. L Luke
fYear :
1998
fDate :
18-23 Oct 1998
Firstpage :
254
Lastpage :
257
Abstract :
Nonlinearity test is required for many products of various applications, such as in consumer and is difficult to rest when sources and meters are nonlinear. A novel method using digital signal processing (DSP) techniques is presented to reduce the errors introduced by nonlinear source and meter. It uses the Taylor series representation to model the nonlinearity of source, meter, and device under lest (DUT). The nonlinearity coefficients of the overall stages are distorted by the nonlinear source and meter. These coefficients can be corrected by the nonlinearity coefficients with the DUT bypassed; accordingly the errors introduced by the nonlinear source and meter are minimized
Keywords :
digital signal processing chips; electric distortion measurement; electronic equipment testing; nonlinear systems; Taylor series representation; device under lest; digital signal processing; nonlinear source; nonlinear source and meter; nonlinearity coefficients; nonlinearity test; Digital signal processing; Distortion measurement; Error correction; Harmonic analysis; Instruments; Nonlinear distortion; Signal analysis; Taylor series; Testing; Total harmonic distortion;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Test Conference, 1998. Proceedings., International
Conference_Location :
Washington, DC
ISSN :
1089-3539
Print_ISBN :
0-7803-5093-6
Type :
conf
DOI :
10.1109/TEST.1998.743160
Filename :
743160
Link To Document :
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