• DocumentCode
    332820
  • Title

    Core test connectivity, communication, and control

  • Author

    Whetsel, Lee

  • Author_Institution
    Texas Instrum. Inc., USA
  • fYear
    1998
  • fDate
    18-23 Oct 1998
  • Firstpage
    303
  • Lastpage
    312
  • Abstract
    This paper describes work at TI on a scan test architecture that provides test connectivity, communication, and control of embedded cores within system ICs. Low power scan testing and hierarchical reuse are also provided by the test architecture
  • Keywords
    automatic testing; industrial control; industrial property; integrated circuit testing; logic testing; production testing; IC test architecture; communication; control; core test connectivity; embedded cores; hierarchical controller; hierarchical reuse; low power scan testing; parallel scan controllers; parallel scan distributors; scan test architecture; streamlined testing; system IC; Aerodynamics; Bandwidth; Circuit testing; Combinational circuits; Communication system control; Costs; Equations; Integrated circuit testing; Logic testing; System testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Conference, 1998. Proceedings., International
  • Conference_Location
    Washington, DC
  • ISSN
    1089-3539
  • Print_ISBN
    0-7803-5093-6
  • Type

    conf

  • DOI
    10.1109/TEST.1998.743168
  • Filename
    743168
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=332820