Title :
Core test connectivity, communication, and control
Author_Institution :
Texas Instrum. Inc., USA
Abstract :
This paper describes work at TI on a scan test architecture that provides test connectivity, communication, and control of embedded cores within system ICs. Low power scan testing and hierarchical reuse are also provided by the test architecture
Keywords :
automatic testing; industrial control; industrial property; integrated circuit testing; logic testing; production testing; IC test architecture; communication; control; core test connectivity; embedded cores; hierarchical controller; hierarchical reuse; low power scan testing; parallel scan controllers; parallel scan distributors; scan test architecture; streamlined testing; system IC; Aerodynamics; Bandwidth; Circuit testing; Combinational circuits; Communication system control; Costs; Equations; Integrated circuit testing; Logic testing; System testing;
Conference_Titel :
Test Conference, 1998. Proceedings., International
Conference_Location :
Washington, DC
Print_ISBN :
0-7803-5093-6
DOI :
10.1109/TEST.1998.743168
