• DocumentCode
    3328243
  • Title

    A digital line-camera for energy resolved X-ray photon counting

  • Author

    Wang, Xiaolan ; Meier, Dirk ; Sundal, Bjorn M. ; Oya, Petter ; Maehlum, Gunnar E. ; Wagenaar, Douglas J. ; Patt, Bradley E. ; Tsui, Benjamin M W ; Frey, Eric C.

  • Author_Institution
    Dept. of Radiol. & Radiol. Sci., Johns Hopkins Univ., Baltimore, MD, USA
  • fYear
    2009
  • fDate
    Oct. 24 2009-Nov. 1 2009
  • Firstpage
    3453
  • Lastpage
    3457
  • Abstract
    We describe a digital line-camera that can be used for computed tomography (CT) with energy resolved x-ray photon counting (XPC) capability. The camera is based on pixellated cadmium telluride (CdTe) radiation sensors and application specific integrated circuits (ASICs). Each camera pixel simultaneously counts x-rays in multiple energy bins providing the capability for ¿color¿ x-ray imaging and energy weighted x-ray CT. The camera can be used in pre-clinical x-ray microCT, where energy resolved photon counting is capable of improving contrast in the image and reducing radiation dose to the subject. We began testing the camera using 120-kVp polychromatic x-rays illuminating a phantom consisting of different test materials. Projection data of x-ray intensity transmitted through the phantom at different views were acquired and reconstructed to obtain tomographic images. This article describes the functionality and performance of the camera, and presents preliminary results from x-ray microCT with phantoms.
  • Keywords
    X-ray imaging; application specific integrated circuits; cadmium compounds; cameras; computerised tomography; phantoms; photon counting; ASIC; X-ray photon counting; XPC; application specific integrated circuits; cadmium telluride radiation sensors; camera pixel; computed tomography; digital line-camera; multiple energy bins; phantom; radiation dose; tomographic images; x-ray imaging; Cadmium compounds; Cameras; Computed tomography; Energy resolution; Imaging phantoms; Materials testing; Optoelectronic and photonic sensors; Photonic integrated circuits; Single photon emission computed tomography; X-ray imaging;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Nuclear Science Symposium Conference Record (NSS/MIC), 2009 IEEE
  • Conference_Location
    Orlando, FL
  • ISSN
    1095-7863
  • Print_ISBN
    978-1-4244-3961-4
  • Electronic_ISBN
    1095-7863
  • Type

    conf

  • DOI
    10.1109/NSSMIC.2009.5401785
  • Filename
    5401785