DocumentCode :
3328243
Title :
A digital line-camera for energy resolved X-ray photon counting
Author :
Wang, Xiaolan ; Meier, Dirk ; Sundal, Bjorn M. ; Oya, Petter ; Maehlum, Gunnar E. ; Wagenaar, Douglas J. ; Patt, Bradley E. ; Tsui, Benjamin M W ; Frey, Eric C.
Author_Institution :
Dept. of Radiol. & Radiol. Sci., Johns Hopkins Univ., Baltimore, MD, USA
fYear :
2009
fDate :
Oct. 24 2009-Nov. 1 2009
Firstpage :
3453
Lastpage :
3457
Abstract :
We describe a digital line-camera that can be used for computed tomography (CT) with energy resolved x-ray photon counting (XPC) capability. The camera is based on pixellated cadmium telluride (CdTe) radiation sensors and application specific integrated circuits (ASICs). Each camera pixel simultaneously counts x-rays in multiple energy bins providing the capability for ¿color¿ x-ray imaging and energy weighted x-ray CT. The camera can be used in pre-clinical x-ray microCT, where energy resolved photon counting is capable of improving contrast in the image and reducing radiation dose to the subject. We began testing the camera using 120-kVp polychromatic x-rays illuminating a phantom consisting of different test materials. Projection data of x-ray intensity transmitted through the phantom at different views were acquired and reconstructed to obtain tomographic images. This article describes the functionality and performance of the camera, and presents preliminary results from x-ray microCT with phantoms.
Keywords :
X-ray imaging; application specific integrated circuits; cadmium compounds; cameras; computerised tomography; phantoms; photon counting; ASIC; X-ray photon counting; XPC; application specific integrated circuits; cadmium telluride radiation sensors; camera pixel; computed tomography; digital line-camera; multiple energy bins; phantom; radiation dose; tomographic images; x-ray imaging; Cadmium compounds; Cameras; Computed tomography; Energy resolution; Imaging phantoms; Materials testing; Optoelectronic and photonic sensors; Photonic integrated circuits; Single photon emission computed tomography; X-ray imaging;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Nuclear Science Symposium Conference Record (NSS/MIC), 2009 IEEE
Conference_Location :
Orlando, FL
ISSN :
1095-7863
Print_ISBN :
978-1-4244-3961-4
Electronic_ISBN :
1095-7863
Type :
conf
DOI :
10.1109/NSSMIC.2009.5401785
Filename :
5401785
Link To Document :
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