• DocumentCode
    3328365
  • Title

    Electron field emission from nanoporous carbon material: effect of surface and material characterization

  • Author

    Vinogradov, A.Y. ; Abramov, A.S. ; Kosarev, A.I. ; Shutov, M.V. ; Andronov, A.N. ; Kordeev, S.K. ; Kortchagina, S.B.

  • Author_Institution
    A.F. Ioffe Physicotech. Inst., Acad. of Sci., St. Petersburg, Russia
  • fYear
    2001
  • fDate
    2001
  • Firstpage
    255
  • Lastpage
    256
  • Abstract
    Electron field emission, surface morphology, work function, and structure of nanoporous carbon materials have been studied. The samples studied had graphite structure and some of them demonstrated a significant concentration of rather uniformly distributed emission centers. Emission properties of the samples with smooth surfaces (uniformities <1 μm) depended on the work function of the material. Emission properties of the samples with rough surfaces (uniformities >10 μm) did not depend on the work function, but emission site distribution depended on the distribution and concentration of surface "grains". So, field emission from the samples had different nature in spite of similar material composition and structure
  • Keywords
    carbon; electron field emission; nanostructured materials; porous materials; surface topography; work function; 1 micron; 10 micron; C; electron field emission; emission properties; emission site distribution; graphite structure; material characterization; material composition; material structure; nanoporous carbon materials; rough surface; surface characterization; surface grain concentration; surface grain distribution; surface grains; surface morphology; surface uniformity; uniformly distributed emission centers; work function; Carbon dioxide; Composite materials; Electron emission; Nanoporous materials; Nanostructured materials; Organic materials; Rough surfaces; Skeleton; Surface morphology; Surface roughness;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Vacuum Microelectronics Conference, 2001. IVMC 2001. Proceedings of the 14th International
  • Conference_Location
    Davis, CA
  • Print_ISBN
    0-7803-7197-6
  • Type

    conf

  • DOI
    10.1109/IVMC.2001.939750
  • Filename
    939750