Title :
International Test Conference 1999. Proceedings (IEEE Cat. No.99CH37034)
Abstract :
Presents the front cover of the proceedings.
Keywords :
automatic test equipment; automatic testing; built-in self test; design for testability; integrated circuit testing; logic testing; production testing; ADC testing; ATE; ATPG; BIST; DFT; IC process defects; MCM; MEMS fault modeling; MEMS test; analog test; benchmark circuits; board test; delay testing; design for diagnostics; design validation; dynamic current testing; embedded core test; embedded memories; fault simulation; high-speed testing; interconnect test; known-good-die testing; low power; memory testing; microprocessor testing; mixed-signal test; on-line testing; optical probing; production wafer test; real test software; system test; tester accuracy; virtual test software; volume production testing;
Conference_Titel :
Test Conference, 1999. Proceedings. International
Conference_Location :
Atlantic City, NJ, USA
Print_ISBN :
0-7803-5753-1
DOI :
10.1109/TEST.1999.805609
