Diagnosis and characterization of timing-related defects by time-dependent light emission

Author

Knebel, Dan ; Sanda, Pia ; McManus, Michael ; Kash, J.A. ; Tsang, J.C. ; Vallett, Dave ; Huisman, Leendert ; Nigh, Phil ; Rizzolo, Rick ; Song, Peilin ; Motika, Franco

Author_Institution

IBM Thomas J. Watson Res. Center, Yorktown Heights, NY, USA

fYear

1998

fDate

18-23 Oct 1998

Firstpage

733

Lastpage

739

Abstract

Technological advances such as flip-chip packaging, multiple hierarchical wiring planes, and ultra-high frequencies reduce the effectiveness of conventional diagnostic techniques. It has recently been demonstrated that light pulses emitted during circuit switching can be used to characterize the behaviour of integrated circuits. In this paper, a new method of circuit characterization using this technique is described. An example of the diagnosis of a timing failure caused by a resistive path to a single transistor is described

Keywords

automatic testing; failure analysis; fault diagnosis; flip-chip devices; integrated circuit testing; timing; wiring; circuit characterization; circuit switching; flip-chip packaging; light pulses; multiple hierarchical wiring planes; resistive path; time-dependent light emission; timing failure; timing-related defects; ultra-high frequencies; CMOS logic circuits; Circuit testing; Failure analysis; Frequency; Integrated circuit testing; Packaging; Spatial resolution; Time factors; Timing; Wiring;

fLanguage

English

Publisher

ieee

Conference_Titel

Test Conference, 1998. Proceedings., International

Conference_Location

Washington, DC

ISSN

1089-3539

Print_ISBN

0-7803-5093-6

Type

conf

DOI

10.1109/TEST.1998.743254

Filename

743254