Title :
Expediting ramp-to-volume production
Author :
Balachandran, Hari ; Parker, Jason ; Gammie, Gordon ; Olson, John ; Force, Craig ; Butler, Kenneth M. ; Jandhyala, Sri
Author_Institution :
M/S 8714, Texas Instrum. Inc., Dallas, TX, USA
Abstract :
High levels of integration have complicated the entire IC manufacturing process. Crucial steps such as ramp to volume production and yield improvement techniques are being challenged. In this paper, a diagnostic system that has been developed and deployed into a production environment is presented. Experiments conducted demonstrating the value of the diagnostic tool and its limitations are presented
Keywords :
automatic test pattern generation; boundary scan testing; electron beam testing; fault diagnosis; integrated circuit testing; production testing; ATPG; IC manufacturing process; automated diagnosis; boundary scan fail; diagnostic system; electron beam probing; failure site isolation; high levels of integration; internal scan; production environment; ramp to volume production; wafer probe; yield improvement; Design for testability; Image analysis; Instruments; Integrated circuit yield; Manufacturing processes; Packaging; Photonic crystals; Production systems; Semiconductor device manufacture; Time to market;
Conference_Titel :
Test Conference, 1999. Proceedings. International
Conference_Location :
Atlantic City, NJ
Print_ISBN :
0-7803-5753-1
DOI :
10.1109/TEST.1999.805619
