Title :
Test process optimization: closing the gap in the defect spectrum
Author :
Barrett, Norma ; Martin, Simon ; Dislis, Chryssa
Author_Institution :
Sector of Network Solution, Motorola Ireland Ltd., Cork, Ireland
Abstract :
This paper describes our methodology of tuning the test process of the Motorola Operations and Maintenance Center product to systematically reduce field defects. The benefits include improved test cases, reduced defects and the availability of up to date field data for feature verification
Keywords :
program testing; software fault tolerance; software maintenance; GSM cellular products; Motorola product test process; defect coverage; defect spectrum; feature verification; mapping process gaps; orthogonal defect classification; reduced field defects; requirements-derived test; software testing tuning model; systematic trend analysis; test process optimization; Base stations; Cellular networks; Feedback; GSM; Graphical user interfaces; Intelligent networks; Land mobile radio cellular systems; Software testing; System testing; Time to market;
Conference_Titel :
Test Conference, 1999. Proceedings. International
Conference_Location :
Atlantic City, NJ
Print_ISBN :
0-7803-5753-1
DOI :
10.1109/TEST.1999.805621
