Title :
Towards reducing “functional only” fails for the UltraSPARCTM microprocessors
Author_Institution :
Texas Instrum. Inc., Stafford, TX, USA
Abstract :
A description of test coverage on the UltraSPARC family of devices is presented. Techniques developed with the intent to reduce “functional only” failures are discussed along with the resulting impact to the manufacturing process
Keywords :
automatic test pattern generation; computer debugging; design for manufacture; design for testability; embedded systems; fault diagnosis; integrated circuit testing; logic testing; microprocessor chips; pipeline processing; RamTest array tests; UltraSPARC microprocessors; debug methods; embedded RAM arrays; fault coverage; full scan logic; internal scan diagnosis; reduced functional only fails; stuck-at-fault ATPG; test coverage; Automatic test pattern generation; CMOS technology; Clocks; Failure analysis; Instruments; Manufacturing processes; Microprocessors; Pattern analysis; Silicon; Testing;
Conference_Titel :
Test Conference, 1999. Proceedings. International
Conference_Location :
Atlantic City, NJ
Print_ISBN :
0-7803-5753-1
DOI :
10.1109/TEST.1999.805624
