Using iterative test generation in a PC based guided probe testing system

Author

Goad, Kenneth G. ; Tront, Joseph G. ; McKeeman, John C.

Author_Institution

Virginia Polytech. Inst. & State Univ., Blacksburg, VA, USA

fYear

1989

fDate

9-12 Apr 1989

Firstpage

1180

Abstract

The model for an automated guided probe implemented on a IBM personal computer-based system is presented. With the addition of a few interface cards and the appropriate software, a PC can be transformed into a tester capable of driving an X-Y prober. Thus existing PC systems can be upgraded to acquire testing capability. An additional benefit of the PC-based system is the ability to do CAD layout of PCBs (printed circuit boards) at the same station. This advantage allows an engineer to test a prototype board during the design stages of a PCB

Keywords

automatic test equipment; automatic testing; integrated circuit testing; microcomputer applications; printed circuit testing; CAD layout; IBM personal computer-based system; PC based guided probe testing system; PC-based system; PCBs; X-Y prober; automated guided probe; computer-aided design; interface cards; iterative test generation; printed circuit boards; prototype board; tester; Automatic testing; Circuit faults; Circuit testing; Performance evaluation; Printed circuits; Probes; Software libraries; Software testing; System testing; Throughput;

fLanguage

English

Publisher

ieee

Conference_Titel

Southeastcon '89. Proceedings. Energy and Information Technologies in the Southeast., IEEE

Conference_Location

Columbia, SC

Type

conf

DOI

10.1109/SECON.1989.132609

Filename

132609