Title :
Multi-source inverse-geometry CT: From system concept to research prototype
Author :
De Man, Bruno ; Caiafa, Antonio ; Cao, Yang ; Frutschy, Kristopher ; Harrison, Daniel ; Inzinna, Lou ; Longtin, Randy ; Neculaes, Bogdan ; Reynolds, Joseph ; Roy, Jaydeep ; Short, Jonathan ; Uribe, Jorge ; Waters, William ; Yin, Zhye ; Zhang, Xi ; Zou, Yu
Author_Institution :
GE Global Res., Niskayuna, NY, USA
fDate :
Oct. 24 2009-Nov. 1 2009
Abstract :
Third-generation CT architectures are approaching fundamental limits. Dose-efficiency is limited by finite detector efficiency and by limited control over the X-ray flux spatial profile. Increasing the volumetric coverage comes with increased scattered radiation, cone-beam artifacts, Heel effect, wasted dose and cost. Spatial resolution is limited by focal spot size and detector cell size. Temporal resolution is limited by mechanical constraints, and alternative geometries such as electron-beam CT and dual-source CT come with severe tradeoffs in terms of image quality, dose-efficiency and complexity. The concept of multi-source inverse-geometry CT (IGCT) breaks through several of the above limitations, promising a low-dose high image quality volumetric CT architecture. In this paper, we present recent progress with the design and integration efforts of the first gantry-based multi-source CT scanner.
Keywords :
X-ray detection; biomedical imaging; computerised tomography; dosimetry; Heel effect; X-ray flux spatial profile; cone-beam artifacts; detector cell size; dose efficiency; dual-source CT; electron-beam CT; finite detector efficiency; focal spot size; gantry-based multisource CT scanner; image quality; multisource inverse geometry CT; scattered radiation; volumetric coverage; wasted dose; Computed tomography; Costs; Geometry; Image quality; Image resolution; Prototypes; Spatial resolution; X-ray detection; X-ray detectors; X-ray scattering;
Conference_Titel :
Nuclear Science Symposium Conference Record (NSS/MIC), 2009 IEEE
Conference_Location :
Orlando, FL
Print_ISBN :
978-1-4244-3961-4
Electronic_ISBN :
1095-7863
DOI :
10.1109/NSSMIC.2009.5401808