DocumentCode
3328717
Title
Multi-source inverse-geometry CT: From system concept to research prototype
Author
De Man, Bruno ; Caiafa, Antonio ; Cao, Yang ; Frutschy, Kristopher ; Harrison, Daniel ; Inzinna, Lou ; Longtin, Randy ; Neculaes, Bogdan ; Reynolds, Joseph ; Roy, Jaydeep ; Short, Jonathan ; Uribe, Jorge ; Waters, William ; Yin, Zhye ; Zhang, Xi ; Zou, Yu
Author_Institution
GE Global Res., Niskayuna, NY, USA
fYear
2009
fDate
Oct. 24 2009-Nov. 1 2009
Firstpage
3531
Lastpage
3533
Abstract
Third-generation CT architectures are approaching fundamental limits. Dose-efficiency is limited by finite detector efficiency and by limited control over the X-ray flux spatial profile. Increasing the volumetric coverage comes with increased scattered radiation, cone-beam artifacts, Heel effect, wasted dose and cost. Spatial resolution is limited by focal spot size and detector cell size. Temporal resolution is limited by mechanical constraints, and alternative geometries such as electron-beam CT and dual-source CT come with severe tradeoffs in terms of image quality, dose-efficiency and complexity. The concept of multi-source inverse-geometry CT (IGCT) breaks through several of the above limitations, promising a low-dose high image quality volumetric CT architecture. In this paper, we present recent progress with the design and integration efforts of the first gantry-based multi-source CT scanner.
Keywords
X-ray detection; biomedical imaging; computerised tomography; dosimetry; Heel effect; X-ray flux spatial profile; cone-beam artifacts; detector cell size; dose efficiency; dual-source CT; electron-beam CT; finite detector efficiency; focal spot size; gantry-based multisource CT scanner; image quality; multisource inverse geometry CT; scattered radiation; volumetric coverage; wasted dose; Computed tomography; Costs; Geometry; Image quality; Image resolution; Prototypes; Spatial resolution; X-ray detection; X-ray detectors; X-ray scattering;
fLanguage
English
Publisher
ieee
Conference_Titel
Nuclear Science Symposium Conference Record (NSS/MIC), 2009 IEEE
Conference_Location
Orlando, FL
ISSN
1095-7863
Print_ISBN
978-1-4244-3961-4
Electronic_ISBN
1095-7863
Type
conf
DOI
10.1109/NSSMIC.2009.5401808
Filename
5401808
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