• DocumentCode
    332874
  • Title

    Modeling the unknown! Towards model-independent fault and error diagnosis

  • Author

    Boppana, Vamsi ; Fujita, Masahiro

  • Author_Institution
    Fujitsu Labs. of America Inc., Sunnyvale, CA, USA
  • fYear
    1998
  • fDate
    18-23 Oct 1998
  • Firstpage
    1094
  • Lastpage
    1101
  • Abstract
    In this paper, we provide techniques for fault and error diagnosis based on capturing unmodeled faulty behavior. We present a technique for capturing the effects of all possible faulty behaviors that can be generated from specific sets of nodes (called X-lists) in the circuit. Since all possible erroneous behaviors are captured, this provides a way for drawing powerful diagnostic inferences about the presence of faults at these sets of nodes when analyzing the observed faulty responses. We also present an efficient diagnosis algorithm that exploits the modeling of all possible behaviors and can be built in a framework of conventional test and simulation tools. Experimental results with numerous diagnosis experiments are then used to demonstrate that the techniques developed can indeed be used to achieve significant improvements in the accuracy of diagnosis
  • Keywords
    automatic test pattern generation; design for testability; fault simulation; integrated circuit testing; logic testing; IC failure location; X-lists; design errors; diagnosis accuracy; diagnostic inferences; efficient diagnosis algorithm; error diagnosis; fault diagnosis; manufacturing faults; matching algorithm; model-independent diagnosis; simulation algorithm; specific sets of nodes; unmodeled faulty behavior; Circuit faults; Circuit testing; Coupling circuits; Dictionaries; Failure analysis; Fault diagnosis; Heuristic algorithms; Inference algorithms; Laboratories; Manufacturing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Conference, 1998. Proceedings., International
  • Conference_Location
    Washington, DC
  • ISSN
    1089-3539
  • Print_ISBN
    0-7803-5093-6
  • Type

    conf

  • DOI
    10.1109/TEST.1998.743310
  • Filename
    743310