DocumentCode :
332874
Title :
Modeling the unknown! Towards model-independent fault and error diagnosis
Author :
Boppana, Vamsi ; Fujita, Masahiro
Author_Institution :
Fujitsu Labs. of America Inc., Sunnyvale, CA, USA
fYear :
1998
fDate :
18-23 Oct 1998
Firstpage :
1094
Lastpage :
1101
Abstract :
In this paper, we provide techniques for fault and error diagnosis based on capturing unmodeled faulty behavior. We present a technique for capturing the effects of all possible faulty behaviors that can be generated from specific sets of nodes (called X-lists) in the circuit. Since all possible erroneous behaviors are captured, this provides a way for drawing powerful diagnostic inferences about the presence of faults at these sets of nodes when analyzing the observed faulty responses. We also present an efficient diagnosis algorithm that exploits the modeling of all possible behaviors and can be built in a framework of conventional test and simulation tools. Experimental results with numerous diagnosis experiments are then used to demonstrate that the techniques developed can indeed be used to achieve significant improvements in the accuracy of diagnosis
Keywords :
automatic test pattern generation; design for testability; fault simulation; integrated circuit testing; logic testing; IC failure location; X-lists; design errors; diagnosis accuracy; diagnostic inferences; efficient diagnosis algorithm; error diagnosis; fault diagnosis; manufacturing faults; matching algorithm; model-independent diagnosis; simulation algorithm; specific sets of nodes; unmodeled faulty behavior; Circuit faults; Circuit testing; Coupling circuits; Dictionaries; Failure analysis; Fault diagnosis; Heuristic algorithms; Inference algorithms; Laboratories; Manufacturing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Test Conference, 1998. Proceedings., International
Conference_Location :
Washington, DC
ISSN :
1089-3539
Print_ISBN :
0-7803-5093-6
Type :
conf
DOI :
10.1109/TEST.1998.743310
Filename :
743310
Link To Document :
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