DocumentCode
332874
Title
Modeling the unknown! Towards model-independent fault and error diagnosis
Author
Boppana, Vamsi ; Fujita, Masahiro
Author_Institution
Fujitsu Labs. of America Inc., Sunnyvale, CA, USA
fYear
1998
fDate
18-23 Oct 1998
Firstpage
1094
Lastpage
1101
Abstract
In this paper, we provide techniques for fault and error diagnosis based on capturing unmodeled faulty behavior. We present a technique for capturing the effects of all possible faulty behaviors that can be generated from specific sets of nodes (called X-lists) in the circuit. Since all possible erroneous behaviors are captured, this provides a way for drawing powerful diagnostic inferences about the presence of faults at these sets of nodes when analyzing the observed faulty responses. We also present an efficient diagnosis algorithm that exploits the modeling of all possible behaviors and can be built in a framework of conventional test and simulation tools. Experimental results with numerous diagnosis experiments are then used to demonstrate that the techniques developed can indeed be used to achieve significant improvements in the accuracy of diagnosis
Keywords
automatic test pattern generation; design for testability; fault simulation; integrated circuit testing; logic testing; IC failure location; X-lists; design errors; diagnosis accuracy; diagnostic inferences; efficient diagnosis algorithm; error diagnosis; fault diagnosis; manufacturing faults; matching algorithm; model-independent diagnosis; simulation algorithm; specific sets of nodes; unmodeled faulty behavior; Circuit faults; Circuit testing; Coupling circuits; Dictionaries; Failure analysis; Fault diagnosis; Heuristic algorithms; Inference algorithms; Laboratories; Manufacturing;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Conference, 1998. Proceedings., International
Conference_Location
Washington, DC
ISSN
1089-3539
Print_ISBN
0-7803-5093-6
Type
conf
DOI
10.1109/TEST.1998.743310
Filename
743310
Link To Document